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Optics Letters

Optics Letters

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  • Vol. 36, Iss. 17 — Sep. 1, 2011
  • pp: 3440–3442

Modeling of near-field optical diffraction from a subwavelength aperture in a thin conducting film

Jiu Hui Wu  »View Author Affiliations


Optics Letters, Vol. 36, Issue 17, pp. 3440-3442 (2011)
http://dx.doi.org/10.1364/OL.36.003440


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Abstract

A theoretical model, novel to our knowledge, to investigate the near-field optical diffraction from a subwavelength aperture in a thin conducting film is presented. A governing equation for the magnetic field distribution in an optical thin film based on the power flow theorem is derived for the first time. Thus all of the components of the electric and magnetic fields inside or outside the thin film with a subwavelength aperture embedded can be obtained by applying the Hankel transform accurately. Numerical computations are performed to illustrate the edge effect by an enhancement factor of 2.2 and the depolarization phenomenon of the transmission in terms of the distance from the film surface.

© 2011 Optical Society of America

OCIS Codes
(050.1220) Diffraction and gratings : Apertures
(260.1960) Physical optics : Diffraction theory
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Diffraction and Gratings

History
Original Manuscript: March 18, 2011
Revised Manuscript: July 30, 2011
Manuscript Accepted: August 1, 2011
Published: August 30, 2011

Citation
Jiu Hui Wu, "Modeling of near-field optical diffraction from a subwavelength aperture in a thin conducting film," Opt. Lett. 36, 3440-3442 (2011)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-36-17-3440

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