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Optics Letters

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  • Vol. 36, Iss. 20 — Oct. 15, 2011
  • pp: 4026–4028

Surfactant-free solution-dispersible Si nanocrystals surface modification by impurity control

Masatoshi Fukuda, Minoru Fujii, Hiroshi Sugimoto, Kenji Imakita, and Shinji Hayashi  »View Author Affiliations


Optics Letters, Vol. 36, Issue 20, pp. 4026-4028 (2011)
http://dx.doi.org/10.1364/OL.36.004026


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Abstract

Si nanocrystals (Si-NCs) dispersible in polar liquid without surface functionalization by organic molecules have been realized by simultaneously doping n and p type impurities. We show that the codoped Si-NCs are stable in methanol for more than five months, while intrinsic Si-NCs prepared by the same procedure form large agglomerates. The different behavior of the intrinsic and codoped Si-NCs in solutions suggests that doped impurities exist on the surface of Si-NCs and the surface potential is large enough to prevent the agglomeration. The colloidal solution of codoped Si-NCs exhibits broad photoluminescence with the maximum in the near infrared range ( 1.1 1.3 eV ).

© 2011 Optical Society of America

OCIS Codes
(160.6000) Materials : Semiconductor materials
(250.5230) Optoelectronics : Photoluminescence

ToC Category:
Materials

History
Original Manuscript: July 19, 2011
Revised Manuscript: September 7, 2011
Manuscript Accepted: September 8, 2011
Published: October 7, 2011

Citation
Masatoshi Fukuda, Minoru Fujii, Hiroshi Sugimoto, Kenji Imakita, and Shinji Hayashi, "Surfactant-free solution-dispersible Si nanocrystals surface modification by impurity control," Opt. Lett. 36, 4026-4028 (2011)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-36-20-4026


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References

  1. L. T. Canham, J. Appl. Phys. 57, 1046 (1990).
  2. D. Kovalev, H. Heckler, G. Polisski, and F. Koch, Phys. Status Solidi B 215, 871 (1999). [CrossRef]
  3. K. Y. Cheng, R. Anthony, U. W. Kortshagen, and R. J. Holmes, Nano Lett. 10, 1154 (2010). [CrossRef] [PubMed]
  4. M. C. Beard, K. P. Knutsen, P. Yu, J. M. Luther, Q. Song, W. K. Metzger, R. J. Ellingson, and A. J. Nozik, Nano Lett. 7, 2506 (2007). [CrossRef] [PubMed]
  5. F. Erogbogbo, K. Y. Yong, I. Roy, G. Xu, P. N. Prasad, and M. T. Swihart, ACS Nano 2, 873 (2008). [CrossRef]
  6. J. Park, L. Gu, G. Maltzahn, E. Ruoslahti, S. N. Bhatia, and M. J. Sailor, Nat. Mater. 8, 331 (2009). [CrossRef] [PubMed]
  7. S. C. Bayliss, R. Heald, D. I. Fletcher, and L. D. Buckberry, Adv. Mater. 11, 318 (1999). [CrossRef]
  8. Z. F. Li and E. Ruckenstein, Nano Lett. 4, 1463 (2004). [CrossRef]
  9. S. Sato and M. T. Swihart, Chem. Mater. 18, 4083 (2006). [CrossRef]
  10. J. H. Warner, A. Hoshino, K. Yamamoto, and R. D. Tilley, Angew. Chem., Int. Ed. 44, 4550 (2005). [CrossRef]
  11. D. S. English, L. E. Pell, Z. Yu, P. F. Barbara, and B. A. Korgel, Nano Lett. 2, 681 (2002). [CrossRef]
  12. X. Li, Y. He, and M. T. Swihart, Langmuir 20, 4720 (2004). [CrossRef]
  13. A. Gupta, M. T. Swihart, and H. Wiggers, Adv. Funct. Mater. 19, 696 (2009). [CrossRef]
  14. M. Fujii, K. Toshikiyo, Y. Takase, Y. Yamaguchi, and S. Hayashi, J. Appl. Phys. 94, 1990 (2003). [CrossRef]
  15. M. Fujii, Y. Yamaguchi, Y. Takase, K. Ninomiya, and S. Hayashi, Appl. Phys. Lett. 85, 1158 (2004). [CrossRef]
  16. J. Linnros, N. Lalic, A. Galeckas, and V. Grivickas, J. Appl. Phys. 86, 6128 (1999). [CrossRef]
  17. S. Takeoka, M. Fujii, and S. Hayashi, Phys. Rev. B 62, 16820 (2000). [CrossRef]
  18. M. V. Wolkin, J. Jorne, P. M. Fauchet, G. Allan, and C. Delerue, Phys. Rev. Lett. 82, 197 (1999). [CrossRef]
  19. F. Iori, E. Degoli, R. Magri, I. Marri, G. Cantele, D. Ninno, F. Trani, O. Pulci, and S. Ossicini, Phys. Rev. B 76, 085302 (2007). [CrossRef]
  20. X. Chen, X. Pi, and D. Yang, J. Phys. Chem. C 115, 661(2011). [CrossRef]
  21. X. Pi, X. Chen, and D. Yang, J. Phys. Chem. C 115, 9838(2011). [CrossRef]
  22. X. D. Pi, R. Gresback, R. W. Liptak, S. A. Campbell, and U. Kortshagen, Appl. Phys. Lett. 92, 123102 (2008). [CrossRef]
  23. S. M. Sze, Physics of Semiconductor Devices, 2nd ed.(Wiley, 1981).
  24. C. Delerue, M. Lannoo, G. Allan, E. Martin, I. Mihalcescu, J. C. Vial, R. Romestain, F. Muller, and A. Bsiesy, Phys. Rev. Lett. , 75, 2228 (1995). [CrossRef] [PubMed]
  25. C. Delerue, M. Lannoo, G. Allan, and E. Martin, Thin Solid Films 255, 27 (1995). [CrossRef]
  26. M. Fukuda, M. Fujii, and S. Hayashi, J. Lumin. 131, 1066 (2011). [CrossRef]

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