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Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 36, Iss. 22 — Nov. 15, 2011
  • pp: 4458–4460

Ultrashort pulse characterization with a terahertz streak camera

O. Schubert, C. Riek, F. Junginger, A. Sell, A. Leitenstorfer, and R. Huber  »View Author Affiliations


Optics Letters, Vol. 36, Issue 22, pp. 4458-4460 (2011)
http://dx.doi.org/10.1364/OL.36.004458


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Abstract

A phase-locked terahertz transient is exploited as an ultrafast phase gate for femtosecond optical pulses. We directly map out the group delay dispersion of a low-power near-infrared pulse by measuring the electro-optically induced polarization rotation as a function of wavelength. Our experiment covers the spectral window from 1.0 to 1.4 μm and reaches a temporal precision better than 1 fs . A quantitative analysis of the detector response confirms that this streaking technique requires no reconstruction algorithm and is also well suited for the characterization of pulses spanning more than one optical octave.

© 2011 Optical Society of America

OCIS Codes
(190.7110) Nonlinear optics : Ultrafast nonlinear optics
(320.7100) Ultrafast optics : Ultrafast measurements
(140.3295) Lasers and laser optics : Laser beam characterization

ToC Category:
Ultrafast Optics

History
Original Manuscript: August 26, 2011
Manuscript Accepted: September 10, 2011
Published: November 15, 2011

Citation
O. Schubert, C. Riek, F. Junginger, A. Sell, A. Leitenstorfer, and R. Huber, "Ultrashort pulse characterization with a terahertz streak camera," Opt. Lett. 36, 4458-4460 (2011)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-36-22-4458


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