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Three-dimensional profilometry with nearly focused binary phase-shifting algorithms |
Optics Letters, Vol. 36, Issue 23, pp. 4518-4520 (2011)
http://dx.doi.org/10.1364/OL.36.004518
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Abstract
This Letter investigates the effects of different phase-shifting algorithms on the quality of high-resolution three-dimensional (3-D) profilometry produced with nearly focused binary patterns. From theoretical analyses, simulations, and experiments, we found that the nine-step phase-shifting algorithm produces accurate 3-D measurements at high speed without the limited depth range and calibration difficulties that typically plague binary defocusing methods. We also found that the use of more fringe patterns does not necessarily enhance measurement quality.
© 2011 Optical Society of America
OCIS Codes
(100.5070) Image processing : Phase retrieval
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: August 11, 2011
Revised Manuscript: October 16, 2011
Manuscript Accepted: October 17, 2011
Published: November 22, 2011
Citation
Laura Ekstrand and Song Zhang, "Three-dimensional profilometry with nearly focused binary phase-shifting algorithms," Opt. Lett. 36, 4518-4520 (2011)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-36-23-4518
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