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Optical-force-induced artifacts in scanning probe microscopy |
Optics Letters, Vol. 36, Issue 24, pp. 4758-4760 (2011)
http://dx.doi.org/10.1364/OL.36.004758
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Abstract
In the practice of near-field scanning probe microscopy, it is typically assumed that the distance regulation is independent of the optical signal. However, we demonstrate that these two signals are entangled due to the inherent action of optically induced force. This coupling leads to artifacts in both estimating the magnitude of optical fields and recording topographic maps.
© 2011 Optical Society of America
OCIS Codes
(180.5810) Microscopy : Scanning microscopy
(180.4243) Microscopy : Near-field microscopy
(120.4880) Instrumentation, measurement, and metrology : Optomechanics
ToC Category:
Microscopy
History
Original Manuscript: August 19, 2011
Revised Manuscript: October 31, 2011
Manuscript Accepted: November 6, 2011
Published: December 13, 2011
Virtual Issues
Vol. 7, Iss. 2 Virtual Journal for Biomedical Optics
Citation
Dana C. Kohlgraf-Owens, Sergey Sukhov, and Aristide Dogariu, "Optical-force-induced artifacts in scanning probe microscopy," Opt. Lett. 36, 4758-4760 (2011)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-36-24-4758
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