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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 36, Iss. 24 — Dec. 15, 2011
  • pp: 4758–4760

Optical-force-induced artifacts in scanning probe microscopy

Dana C. Kohlgraf-Owens, Sergey Sukhov, and Aristide Dogariu  »View Author Affiliations


Optics Letters, Vol. 36, Issue 24, pp. 4758-4760 (2011)
http://dx.doi.org/10.1364/OL.36.004758


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Abstract

In the practice of near-field scanning probe microscopy, it is typically assumed that the distance regulation is independent of the optical signal. However, we demonstrate that these two signals are entangled due to the inherent action of optically induced force. This coupling leads to artifacts in both estimating the magnitude of optical fields and recording topographic maps.

© 2011 Optical Society of America

OCIS Codes
(180.5810) Microscopy : Scanning microscopy
(180.4243) Microscopy : Near-field microscopy
(120.4880) Instrumentation, measurement, and metrology : Optomechanics

ToC Category:
Microscopy

History
Original Manuscript: August 19, 2011
Revised Manuscript: October 31, 2011
Manuscript Accepted: November 6, 2011
Published: December 13, 2011

Virtual Issues
Vol. 7, Iss. 2 Virtual Journal for Biomedical Optics

Citation
Dana C. Kohlgraf-Owens, Sergey Sukhov, and Aristide Dogariu, "Optical-force-induced artifacts in scanning probe microscopy," Opt. Lett. 36, 4758-4760 (2011)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-36-24-4758

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