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Wavefront sensing with critical sampling |
Optics Letters, Vol. 36, Issue 4, pp. 433-435 (2011)
http://dx.doi.org/10.1364/OL.36.000433
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Abstract
Different types of nonredundant sampling patterns are shown to guarantee completeness of the basis formed by the sampled partial derivatives of Zernike polynomials, commonly used to reconstruct the wavefront from its slopes (wavefront sensing). In the ideal noise-free case, this enables one to recover double the number of modes J than sampling points I (critical sampling
© 2011 Optical Society of America
OCIS Codes
(010.7350) Atmospheric and oceanic optics : Wave-front sensing
(220.1010) Optical design and fabrication : Aberrations (global)
(080.1005) Geometric optics : Aberration expansions
ToC Category:
Atmospheric and Oceanic Optics
History
Original Manuscript: October 8, 2010
Revised Manuscript: December 21, 2010
Manuscript Accepted: December 21, 2010
Published: January 31, 2011
Citation
Rafael Navarro, Justo Arines, and Ricardo Rivera, "Wavefront sensing with critical sampling," Opt. Lett. 36, 433-435 (2011)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-36-4-433
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