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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 36, Iss. 4 — Feb. 15, 2011
  • pp: 526–528

Dynamic phase evaluation in sparse-sampled temporal speckle pattern sequence

Y. H. Huang, Y. S. Liu, S. Y. Hung, C. G. Li, and Farrokh Janabi-Sharifi  »View Author Affiliations

Optics Letters, Vol. 36, Issue 4, pp. 526-528 (2011)

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The rapid progress of modern manufacturing technology has posed stringent requirements for inspecting techniques for vibration characterization and dynamic testing. Because of its simplicity, accuracy, and whole-field character, speckle interferometry has served as one of the major techniques for dynamic measurement, where normally a dense-sampled temporal speckle sequence is captured for phase retrieval using Fourier or wavelet transforms. In this Letter, a method is proposed for phase evaluation of sparse-sampled speckle patterns when the sampling rate is lower than two points per temporal cycle. Dynamic experiments using a high-speed camera demonstrated the effectiveness of the proposed method for complicated wrapped phase retrieval in electronic/digital speckle pattern interferometry.

© 2011 Optical Society of America

OCIS Codes
(050.5080) Diffraction and gratings : Phase shift
(090.2880) Holography : Holographic interferometry
(100.5070) Image processing : Phase retrieval
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.5060) Instrumentation, measurement, and metrology : Phase modulation

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: December 7, 2010
Revised Manuscript: January 7, 2011
Manuscript Accepted: January 14, 2011
Published: February 9, 2011

Y. H. Huang, Y. S. Liu, S. Y. Hung, C. G. Li, and Farrokh Janabi-Sharifi, "Dynamic phase evaluation in sparse-sampled temporal speckle pattern sequence," Opt. Lett. 36, 526-528 (2011)

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