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Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 36, Iss. 4 — Feb. 15, 2011
  • pp: 570–572

High-resolution transparent x-ray beam location and imaging

Roelof van Silfhout, Anton Kachatkou, Nicholas Kyele, Peter Scott, Thierry Martin, and Sergey Nikitenko  »View Author Affiliations


Optics Letters, Vol. 36, Issue 4, pp. 570-572 (2011)
http://dx.doi.org/10.1364/OL.36.000570


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Abstract

We present a high-resolution in situ imaging and localization method of energetic particle beams. Recording of the scattered radiation from a thin featureless foil, placed in the path of the beam, and taken with a pinhole or coded aperture camera arrangement magnifies beam movements at the sensor. At the same time, a magnified image of the beam is available with an exceptional signal-to-noise ratio. We show measurement results of the level of precision that can be achieved and compare them to theoretical limits based on the signal-to-noise levels.

© 2011 Optical Society of America

OCIS Codes
(040.7480) Detectors : X-rays, soft x-rays, extreme ultraviolet (EUV)
(120.3940) Instrumentation, measurement, and metrology : Metrology

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: November 8, 2010
Revised Manuscript: December 16, 2010
Manuscript Accepted: January 3, 2011
Published: February 15, 2011

Citation
Roelof van Silfhout, Anton Kachatkou, Nicholas Kyele, Peter Scott, Thierry Martin, and Sergey Nikitenko, "High-resolution transparent x-ray beam location and imaging," Opt. Lett. 36, 570-572 (2011)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-36-4-570


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References

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