We present a high-resolution in situ imaging and localization method of energetic particle beams. Recording of the scattered radiation from a thin featureless foil, placed in the path of the beam, and taken with a pinhole or coded aperture camera arrangement magnifies beam movements at the sensor. At the same time, a magnified image of the beam is available with an exceptional signal-to-noise ratio. We show measurement results of the level of precision that can be achieved and compare them to theoretical limits based on the signal-to-noise levels.
© 2011 Optical Society of America
Instrumentation, Measurement, and Metrology
Original Manuscript: November 8, 2010
Revised Manuscript: December 16, 2010
Manuscript Accepted: January 3, 2011
Published: February 15, 2011
Roelof van Silfhout, Anton Kachatkou, Nicholas Kyele, Peter Scott, Thierry Martin, and Sergey Nikitenko, "High-resolution transparent x-ray beam location and imaging," Opt. Lett. 36, 570-572 (2011)