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Optics Letters

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  • Vol. 36, Iss. 5 — Mar. 1, 2011
  • pp: 627–629

Simple calibration of a phase-based 3D imaging system based on uneven fringe projection

Zonghua Zhang, Haiyan Ma, Sixiang Zhang, Tong Guo, Catherine E. Towers, and David P. Towers  »View Author Affiliations


Optics Letters, Vol. 36, Issue 5, pp. 627-629 (2011)
http://dx.doi.org/10.1364/OL.36.000627


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Abstract

Phase-based fringe projection metrology systems have been widely used to obtain the shape of 3D objects. One vital step is calibration, which defines the relationship between the phase and depth data. Existing calibration methods are complicated because of the dependence of the relationship on the pixel position. In this Letter, a simple calibration procedure is introduced based on an uneven fringe projection technique, in which the relationship between phase and depth becomes independent of the pixel position and can be represented by a single polynomial function for all pixels. Therefore, given a set of discrete points with a known phase and depth in the measuring volume, the coefficient set of the polynomial function can be determined. A white plate having discrete markers with known separation is used to calibrate the 3D imaging system. Experimental results demonstrate that the proposed calibration method is simple to apply and can build up an accurate relationship between phase and depth data.

© 2011 Optical Society of America

OCIS Codes
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.2830) Instrumentation, measurement, and metrology : Height measurements
(150.6910) Machine vision : Three-dimensional sensing
(150.1488) Machine vision : Calibration

ToC Category:
Machine Vision

History
Original Manuscript: November 29, 2010
Revised Manuscript: January 22, 2011
Manuscript Accepted: January 24, 2011
Published: February 18, 2011

Citation
Zonghua Zhang, Haiyan Ma, Sixiang Zhang, Tong Guo, Catherine E. Towers, and David P. Towers, "Simple calibration of a phase-based 3D imaging system based on uneven fringe projection," Opt. Lett. 36, 627-629 (2011)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-36-5-627


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