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Optics Letters

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  • Vol. 36, Iss. 5 — Mar. 1, 2011
  • pp: 672–674

Laser frequency noise immunity in multiplexed displacement sensing

Danielle M. R. Wuchenich, Timothy T.-Y. Lam, Jong H. Chow, David E. McClelland, and Daniel A. Shaddock  »View Author Affiliations


Optics Letters, Vol. 36, Issue 5, pp. 672-674 (2011)
http://dx.doi.org/10.1364/OL.36.000672


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Abstract

Digitally enhanced interferometry (DI) can be used to distinguish between interferometric signals and simultaneously monitor in-line object displacements with subnanometer sensitivity. In contrast to conventional interferometry—where these signals interfere with each other and degrade performance—we experimentally show that by using DI, each of these signals can be isolated and measured at the same time. We present what we believe to be the first demonstration of DI’s signal multiplexing capabilities, showing simultaneous length sensing of three sections of an optical fiber. The cross talk between length measurements was less than 2.6 × 10 3 with a displacement noise floor of 200 pm / Hz , which corresponds to a strain sensitivity of less than 80 picostrain ( p ϵ ) in each sensor. We also enhance our system’s displacement sensitivity at low frequencies by combining information from multiple lengths to suppress errors due to laser frequency noise.

© 2011 Optical Society of America

OCIS Codes
(060.4230) Fiber optics and optical communications : Multiplexing
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3940) Instrumentation, measurement, and metrology : Metrology
(140.3425) Lasers and laser optics : Laser stabilization

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: November 29, 2010
Revised Manuscript: January 11, 2011
Manuscript Accepted: January 18, 2011
Published: February 23, 2011

Citation
Danielle M. R. Wuchenich, Timothy T.-Y. Lam, Jong H. Chow, David E. McClelland, and Daniel A. Shaddock, "Laser frequency noise immunity in multiplexed displacement sensing," Opt. Lett. 36, 672-674 (2011)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-36-5-672

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