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Optics Letters

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  • Vol. 36, Iss. 5 — Mar. 1, 2011
  • pp: 684–686

Random phase mask in a filamentation regime: application to the localization of point sources

Florence de la Barrière, Guillaume Druart, Nicolas Guérineau, Yann Ferrec, Jean Taboury, and Jérôme Primot  »View Author Affiliations


Optics Letters, Vol. 36, Issue 5, pp. 684-686 (2011)
http://dx.doi.org/10.1364/OL.36.000684


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Abstract

We present a optical system with an extended point-spread function (PSF) for the localization of point sources in the visible and IR spectral ranges with a subpixel precision. This compact system involves a random phase mask (RPM) as its unique component. It exhibits original properties, because this RPM is used in a particular regime, called the “filamentation regime,” before the speckle region. The localization is performed by calculating the phase correlation between the PSF and the image obtained under off-axis illumination. Numerical simulations are presented to assess the basic optical properties of this RPM in the filamentation regime.

© 2011 Optical Society of America

OCIS Codes
(030.5770) Coherence and statistical optics : Roughness
(030.6600) Coherence and statistical optics : Statistical optics
(070.7345) Fourier optics and signal processing : Wave propagation

ToC Category:
Coherence and Statistical Optics

History
Original Manuscript: December 16, 2010
Revised Manuscript: January 20, 2011
Manuscript Accepted: January 20, 2011
Published: February 24, 2011

Citation
Florence de la Barrière, Guillaume Druart, Nicolas Guérineau, Yann Ferrec, Jean Taboury, and Jérôme Primot, "Random phase mask in a filamentation regime: application to the localization of point sources," Opt. Lett. 36, 684-686 (2011)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-36-5-684


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