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  • Vol. 36, Iss. 8 — Apr. 15, 2011
  • pp: 1335–1337

Efficiency calibrations of cylindrically bent transmission crystals in the 20 to 80 keV x-ray energy range

Csilla I. Szabo, Uri Feldman, Stephen Seltzer, Lawrence T. Hudson, Michelle O’Brien, Hye-Sook Park, and John F. Seely  »View Author Affiliations


Optics Letters, Vol. 36, Issue 8, pp. 1335-1337 (2011)
http://dx.doi.org/10.1364/OL.36.001335


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Abstract

Two quartz (10–11) crystals were cylindrically bent to a 25.4 cm radius of curvature and were mounted in identical Cauchois-type transmission spectrometers, and the crystal diffraction efficiencies were measured to 5% absolute accuracy using narrow bandwidth x-ray source fluences in the 20  to 80 keV energy range. The measured integrated reflectivity values were compared to calculations performed using a computational model that accounts for the diffraction geometry of the bent transmission crystal. These crystal calibrations enable the accurate measurement of absolute hard x-ray emission levels from laser-produced plasmas and other laboratory sources.

OCIS Codes
(050.1940) Diffraction and gratings : Diffraction
(300.6560) Spectroscopy : Spectroscopy, x-ray
(340.7480) X-ray optics : X-rays, soft x-rays, extreme ultraviolet (EUV)

ToC Category:
X-ray Optics

History
Original Manuscript: December 17, 2010
Revised Manuscript: March 3, 2011
Manuscript Accepted: March 10, 2011
Published: April 6, 2011

Citation
Csilla I. Szabo, Uri Feldman, Stephen Seltzer, Lawrence T. Hudson, Michelle O’Brien, Hye-Sook Park, and John F. Seely, "Efficiency calibrations of cylindrically bent transmission crystals in the 20 to 80 keV x-ray energy range," Opt. Lett. 36, 1335-1337 (2011)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-36-8-1335


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References

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