OSA's Digital Library

Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 36, Iss. 8 — Apr. 15, 2011
  • pp: 1437–1439

Sensitive and robust second-harmonic interferometer for measuring the dispersion of the electro-optic coefficients in bulk materials

T. Del Rosso, D. Grando, P. Marsili, and F. Giammanco  »View Author Affiliations


Optics Letters, Vol. 36, Issue 8, pp. 1437-1439 (2011)
http://dx.doi.org/10.1364/OL.36.001437


View Full Text Article

Enhanced HTML    Acrobat PDF (238 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

Second-harmonic interferometry (SHI) is proposed for measuring the electro-optic (EO) coefficients of massive media. It combines the advantages of interferometric techniques with the mechanical stability of single-beam methods, simultaneously skimming the wavelength dispersion of the EO response. For demonstrating the effectiveness of the SHI technique, the EO coefficients r 33 T and r 13 T of the EO crystal lithium niobate are measured simultaneously at 1064 and 532 nm .

© 2011 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(130.3730) Integrated optics : Lithium niobate
(160.2100) Materials : Electro-optical materials
(190.4400) Nonlinear optics : Nonlinear optics, materials

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: January 28, 2011
Revised Manuscript: March 13, 2011
Manuscript Accepted: March 20, 2011
Published: April 13, 2011

Citation
T. Del Rosso, D. Grando, P. Marsili, and F. Giammanco, "Sensitive and robust second-harmonic interferometer for measuring the dispersion of the electro-optic coefficients in bulk materials," Opt. Lett. 36, 1437-1439 (2011)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-36-8-1437


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. O. Smirnova, Y. Mairesse, S. Patchkovskii, N. Dudovich, D. Villeneuve, P. Corkum, and M. Y. Ivanov, Nature 460, 972 (2009). [CrossRef] [PubMed]
  2. F. Hopf, A. Tomita, and G. Al-Jumaily, Opt. Lett. 5, 386(1980). [CrossRef] [PubMed]
  3. P. D. Henshaw and D. P. DeGloria, J. Vac. Sci. Technol. B 14, 3955 (1996). [CrossRef]
  4. F. Brandi and F. Giammanco, Opt. Lett. 32, 2327 (2007). [CrossRef] [PubMed]
  5. O. Sato, R. Baba, K. Hashimoto, and A. Fujishima, J. Phys. Chem. 95, 9636 (1991). [CrossRef]
  6. S. P. Velsko and D. Eimerl, Appl. Opt. 25, 1344 (1986). [CrossRef] [PubMed]
  7. E. L. Wooten, K. M. Kissa, A. Yi-Yan, E. J. Murphy, D. A. Lafaw, P. F. Hallemeier, D. Maack, D. V. Attanasio, D. J. Fritz, G. J. McBrien, and D. E. Bossi, IEEE J. Sel. Top. Quantum Electron. 6, 69 (2000). [CrossRef]
  8. T. Del Rosso, G. Margheri, S. Sottini, S. Trigari, M. De Sario, F. Prudenzano, and D. Grando, IEEE Sens. J. 7, 417 (2007). [CrossRef]
  9. A. Yariv and P. Yeh, Optical Waves in Crystals (Wiley, 1984).
  10. B. Kamg, B. K. Rhee, and G.-T. Joo, Mater. Lett. 60, 2306(2006). [CrossRef]
  11. M. Zgonik, K. Nakagawa, and P. Guenter, J. Opt. Soc. Am. B 12, 1416 (1995). [CrossRef]
  12. A. Grunnet-Jepsen, I. Aubrecht, and L. Solymar, J. Opt. Soc. Am. B 12, 921 (1995). [CrossRef]
  13. F. Brandi, F. Giammanco, W. S. Harris, T. Roche, E. Trask, and F. J. Vessel, Rev. Sci. Instrum. 80, 113501 (2009). [CrossRef] [PubMed]
  14. K.-H.Kellwege and A.M.Hellwege, eds., Landolt-Börnstein: Numerical Data and Functional Relationships in Sciences and Technology (Springer-Verlag, 1979), Vol.  11.
  15. K. Peithmann, A. Wiebrock, and K. Buse, Appl. Phys. B 68, 777 (1999). [CrossRef]
  16. M. Abarkan, J. P. Salvestrini, M. D. Fontana, and M. Aillerie, Appl. Phys. B 76, 765 (2003). [CrossRef]
  17. D. Grando, V. Bermudez, E. Dieguez, P. Galinetto, M. Marinone, F. Rossella, E. Giulotto, and G. Samoggia, in Proceedings of 8° Convegno Nazionale Strumentazione e Metodi di Misura Elettroottici (Associazione Italiana di Elettrotecnica, 2004), pp. 302–305.
  18. A. Mendez, A. Garcia-Cabanes, E. Dieguez, and J. M. Cabrera, Electron. Lett. 35, 498 (1999). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

Figures

Fig. 1 Fig. 2
 

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited