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Optics Letters


  • Vol. 36, Iss. 8 — Apr. 15, 2011
  • pp: 1437–1439

Sensitive and robust second-harmonic interferometer for measuring the dispersion of the electro-optic coefficients in bulk materials

T. Del Rosso, D. Grando, P. Marsili, and F. Giammanco  »View Author Affiliations

Optics Letters, Vol. 36, Issue 8, pp. 1437-1439 (2011)

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Second-harmonic interferometry (SHI) is proposed for measuring the electro-optic (EO) coefficients of massive media. It combines the advantages of interferometric techniques with the mechanical stability of single-beam methods, simultaneously skimming the wavelength dispersion of the EO response. For demonstrating the effectiveness of the SHI technique, the EO coefficients r 33 T and r 13 T of the EO crystal lithium niobate are measured simultaneously at 1064 and 532 nm .

© 2011 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(130.3730) Integrated optics : Lithium niobate
(160.2100) Materials : Electro-optical materials
(190.4400) Nonlinear optics : Nonlinear optics, materials

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: January 28, 2011
Revised Manuscript: March 13, 2011
Manuscript Accepted: March 20, 2011
Published: April 13, 2011

T. Del Rosso, D. Grando, P. Marsili, and F. Giammanco, "Sensitive and robust second-harmonic interferometer for measuring the dispersion of the electro-optic coefficients in bulk materials," Opt. Lett. 36, 1437-1439 (2011)

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