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Modeling quantitative phase image formation under tilted illuminations |
Optics Letters, Vol. 37, Issue 10, pp. 1718-1720 (2012)
http://dx.doi.org/10.1364/OL.37.001718
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Abstract
A generalized product-of-convolution model for simulation of quantitative phase microscopy of thick heterogeneous specimen under tilted plane-wave illumination is presented. Actual simulations are checked against a much more time-consuming commercial finite-difference time-domain method. Then modeled data are compared with experimental measurements that were made with a quadriwave lateral shearing interferometer.
© 2012 Optical Society of America
OCIS Codes
(110.0180) Imaging systems : Microscopy
(110.4100) Imaging systems : Modulation transfer function
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(180.6900) Microscopy : Three-dimensional microscopy
(090.1995) Holography : Digital holography
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: December 26, 2011
Revised Manuscript: February 27, 2012
Manuscript Accepted: March 19, 2012
Published: May 14, 2012
Virtual Issues
Vol. 7, Iss. 7 Virtual Journal for Biomedical Optics
Citation
Pierre Bon, Benoit Wattellier, and Serge Monneret, "Modeling quantitative phase image formation under tilted illuminations," Opt. Lett. 37, 1718-1720 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-10-1718
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