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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 37, Iss. 10 — May. 15, 2012
  • pp: 1718–1720

Modeling quantitative phase image formation under tilted illuminations

Pierre Bon, Benoit Wattellier, and Serge Monneret  »View Author Affiliations


Optics Letters, Vol. 37, Issue 10, pp. 1718-1720 (2012)
http://dx.doi.org/10.1364/OL.37.001718


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Abstract

A generalized product-of-convolution model for simulation of quantitative phase microscopy of thick heterogeneous specimen under tilted plane-wave illumination is presented. Actual simulations are checked against a much more time-consuming commercial finite-difference time-domain method. Then modeled data are compared with experimental measurements that were made with a quadriwave lateral shearing interferometer.

© 2012 Optical Society of America

OCIS Codes
(110.0180) Imaging systems : Microscopy
(110.4100) Imaging systems : Modulation transfer function
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(180.6900) Microscopy : Three-dimensional microscopy
(090.1995) Holography : Digital holography

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: December 26, 2011
Revised Manuscript: February 27, 2012
Manuscript Accepted: March 19, 2012
Published: May 14, 2012

Virtual Issues
Vol. 7, Iss. 7 Virtual Journal for Biomedical Optics

Citation
Pierre Bon, Benoit Wattellier, and Serge Monneret, "Modeling quantitative phase image formation under tilted illuminations," Opt. Lett. 37, 1718-1720 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-10-1718

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