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Phase retrieval of reflectance for nanoparticle optical identification |
Optics Letters, Vol. 37, Issue 12, pp. 2202-2204 (2012)
http://dx.doi.org/10.1364/OL.37.002202
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Abstract
We present a method for optical identification of dielectric and metal nanoparticles in a liquid matrix using phase retrieval of reflectance with TE- and TM-polarized light. A formula is derived for extracting the effective complex dielectric function of a nanoparticle colloid based on different complex reflectance components. The phase retrieval is performed using the maximum entropy method. We observe excellent accuracy both for dielectric and metallic nanoparticles with volume fractions up to 10%.
© 2012 Optical Society of America
OCIS Codes
(000.3860) General : Mathematical methods in physics
(100.5070) Image processing : Phase retrieval
(120.4530) Instrumentation, measurement, and metrology : Optical constants
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: February 17, 2012
Revised Manuscript: April 4, 2012
Manuscript Accepted: April 5, 2012
Published: June 4, 2012
Citation
Jarkko J. Saarinen, Jun Uozumi, Erik M. Vartiainen, and Kai-Erik Peiponen, "Phase retrieval of reflectance for nanoparticle optical identification," Opt. Lett. 37, 2202-2204 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-12-2202
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