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Optics Letters

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  • Vol. 37, Iss. 13 — Jul. 1, 2012
  • pp: 2685–2687

Optical measurement of acoustic pressure amplitudes—at the sensitivity limits of Rayleigh scattering

Anne Rausch, André Fischer, Nancy Kings, Friedrich Bake, and Ingo Roehle  »View Author Affiliations


Optics Letters, Vol. 37, Issue 13, pp. 2685-2687 (2012)
http://dx.doi.org/10.1364/OL.37.002685


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Abstract

Rayleigh scattering is a measurement technique applicable for the determination of density distributions in various technical or natural flows. The current sensitivity limits of the Rayleigh scattering technique were investigated experimentally. It is shown that it is possible to measure density oscillations caused by acoustic pressure oscillations noninvasively and directly. Acoustical standing waves in a rectangular duct were investigated using Rayleigh scattering and compared to microphone measurements. The comparison showed a sensitivity of the Rayleigh scattering technique of 75 Pa (7·104kg/m3) and a precision of 14 Pa (1·104kg/m3). Therefore, it was also shown that Rayleigh scattering is applicable for acoustic measurements.

© 2012 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.1740) Instrumentation, measurement, and metrology : Combustion diagnostics
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(120.5475) Instrumentation, measurement, and metrology : Pressure measurement

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: January 2, 2012
Manuscript Accepted: April 18, 2012
Published: June 26, 2012

Citation
Anne Rausch, André Fischer, Nancy Kings, Friedrich Bake, and Ingo Roehle, "Optical measurement of acoustic pressure amplitudes—at the sensitivity limits of Rayleigh scattering," Opt. Lett. 37, 2685-2687 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-13-2685


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