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Polarization resolved reflection from ordered vertical silicon nanowire arrays |
Optics Letters, Vol. 37, Issue 14, pp. 2961-2963 (2012)
http://dx.doi.org/10.1364/OL.37.002961
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Abstract
We measure polarization resolved reflections from ordered vertical silicon nanowire arrays of two different diameters and compare the results to rigorous coupled wave analysis simulations. Ellipsometric analysis based on anisotropic effective-medium approximation is used to fit the experimental data and estimate the diameter and length of the nanowires. In addition, depolarization of light is observed for wavelengths below 400 nm.
© 2012 Optical Society of America
OCIS Codes
(160.4236) Materials : Nanomaterials
(050.6624) Diffraction and gratings : Subwavelength structures
ToC Category:
Materials
History
Original Manuscript: April 19, 2012
Revised Manuscript: May 23, 2012
Manuscript Accepted: May 24, 2012
Published: July 13, 2012
Citation
M. Khorasaninejad, N. Abedzadeh, J. Sun, J. N. Hilfiker, and S. S. Saini, "Polarization resolved reflection from ordered vertical silicon nanowire arrays," Opt. Lett. 37, 2961-2963 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-14-2961
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