We measure polarization resolved reflections from ordered vertical silicon nanowire arrays of two different diameters and compare the results to rigorous coupled wave analysis simulations. Ellipsometric analysis based on anisotropic effective-medium approximation is used to fit the experimental data and estimate the diameter and length of the nanowires. In addition, depolarization of light is observed for wavelengths below 400 nm.
© 2012 Optical Society of America
Original Manuscript: April 19, 2012
Revised Manuscript: May 23, 2012
Manuscript Accepted: May 24, 2012
Published: July 13, 2012
M. Khorasaninejad, N. Abedzadeh, J. Sun, J. N. Hilfiker, and S. S. Saini, "Polarization resolved reflection from ordered vertical silicon nanowire arrays," Opt. Lett. 37, 2961-2963 (2012)