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Discrimination of field components in optical probe microscopy |
Optics Letters, Vol. 37, Issue 17, pp. 3606-3608 (2012)
http://dx.doi.org/10.1364/OL.37.003606
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Abstract
We demonstrate that the conventional optical signal in near-field scanning optical microscopy and the optical force induced topography contain complementary information about the complex three-dimensional field distribution. Crucially, the additional information about the field distribution can be retrieved without increasing the measurement complexity.
© 2012 Optical Society of America
OCIS Codes
(180.5810) Microscopy : Scanning microscopy
(180.4243) Microscopy : Near-field microscopy
(120.4880) Instrumentation, measurement, and metrology : Optomechanics
ToC Category:
Microscopy
History
Original Manuscript: June 15, 2012
Manuscript Accepted: July 9, 2012
Published: August 24, 2012
Virtual Issues
Vol. 7, Iss. 11 Virtual Journal for Biomedical Optics
Citation
D. C. Kohlgraf-Owens, S. Sukhov, and A. Dogariu, "Discrimination of field components in optical probe microscopy," Opt. Lett. 37, 3606-3608 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-17-3606
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