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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 37, Iss. 18 — Sep. 15, 2012
  • pp: 3765–3767

How to optically count graphene layers

Sosan Cheon, Kenneth David Kihm, Jae Sung Park, Joon Sik Lee, Byeong Jun Lee, Hyeoungkeun Kim, and Byung Hee Hong  »View Author Affiliations

Optics Letters, Vol. 37, Issue 18, pp. 3765-3767 (2012)

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The total thickness of a graphene sample depends upon the number of individually stacked graphene layers. The corresponding surface plasmon resonance (SPR) reflectance alters the SPR angle, depending on the number of graphene layers. Thus, the correlation between the SPR angle shift and the number of graphene layers allows for a nonintrusive, real-time, and reliable counting of graphene layers. A single-layer graphene (SLG) is synthesized by means of chemical vapor deposition, followed by physical transfer to a thin gold film (48 nm) repeatedly, so that multilayer graphene samples with one, three, and five layers can be prepared. Both the measured SPR angles and the entire reflectance curve profiles successfully distinguish the number of graphene layers.

© 2012 Optical Society of America

OCIS Codes
(240.0240) Optics at surfaces : Optics at surfaces
(310.0310) Thin films : Thin films

ToC Category:
Optics at Surfaces

Original Manuscript: July 6, 2012
Revised Manuscript: July 30, 2012
Manuscript Accepted: July 30, 2012
Published: September 5, 2012

Sosan Cheon, Kenneth David Kihm, Jae Sung Park, Joon Sik Lee, Byeong Jun Lee, Hyeoungkeun Kim, and Byung Hee Hong, "How to optically count graphene layers," Opt. Lett. 37, 3765-3767 (2012)

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  1. A. K. Geim and K. S. Novoselov, Nat. Mater. 6, 183 (2007). [CrossRef]
  2. A. K. Geim, Science 324, 1530 (2009). [CrossRef]
  3. C. Lee, X. Wei, J. W. Kysar, and J. Hone, Science 321, 385 (2008). [CrossRef]
  4. K. S. Kim, Y. Zhao, H. Jang, S. Y. Lee, J. M. Kim, K. S. Kim, J.-H. Ahn, P. Kim, J.-Y. Choi, and B. H. Hong, Nature 457, 706 (2009). [CrossRef]
  5. Y.-M. Lin, K. A. Jenkins, A. Valdes-Garcia, J. P. Small, D. B. Farmer, and P. Avouris, Nano Lett. 9, 422 (2008). [CrossRef]
  6. Y. Sui and J. Appenzeller, Nano Lett. 9, 2973 (2009). [CrossRef]
  7. P. Gava, M. Lazzeri, A. M. Saitta, and F. Mauri, Phys. Rev. B 79, 165431 (2009). [CrossRef]
  8. D. Graf, F. Molitor, K. Ensslin, C. Stampfer, A. Jungen, C. Hierold, and L. Wirtz, Nano Lett. 7, 238 (2007). [CrossRef]
  9. A. C. Ferrari, J. C. Meyer, V. Scardaci, C. Casiraghi, M. Lazzeri, F. Mauri, S. Piscanec, D. Jiang, K. S. Novoselov, S. Roth, and A. K. Geim, Phys. Rev. Lett. 97, 187401(2006). [CrossRef]
  10. I. Calizo, W. Z. Bao, F. Miao, C. N. Lau, and A. A. Balandin, Appl. Phys. Lett. 91, 201904 (2007). [CrossRef]
  11. A. Gupta, G. Chen, P. Joshi, S. Tadigadapa, and Eklund, Nano Lett. 6, 2667 (2006). [CrossRef]
  12. D. Yoon, H. Moon, Y.-W. Son, J. S. Choi, B. H. Park, Y. H. Cha, Y. D. Kim, and H. Cheong, Phys. Rev. B 80, 125422 (2009). [CrossRef]
  13. C. Casiraghi, S. Pisana, K. S. Novoselov, A. K. Geim, and A. C. Ferrari, Appl. Phys. Lett. 91, 233108 (2007). [CrossRef]
  14. L. M. Malard, M. H. D. Guimaraes, D. L. Mafra, M. S. C. Mazzoni, and A. Jorio, Phys. Rev. B 79, 125426 (2009). [CrossRef]
  15. J. Hass, F. Varchon, J. E. Millán-Otoya, M. Sprinkle, N. Sharma, W. A. de Heer, C. Berger, P. N. First, L. Magaud, and E. H. Conrad, Phys. Rev. Lett. 100, 125504 (2008). [CrossRef]
  16. Z. Ni, Y. Wang, T. Yu, Y. You, and Z. Shen, Phys. Rev. B 77, 235403 (2008). [CrossRef]
  17. X. Li, Y. Zhu, W. Cai, M. Borysiak, B. Han, D. Chen, R. D. Piner, L. Colombo, and R. S. Ruoff, Nano Lett. 9, 4359 (2009). [CrossRef]
  18. J. Kang, H. Kim, K. S. Kim, S.-K. Lee, S. Bae, J.-H. Ahn, Y.-J. Kim, J.-B. Choi, and B. H. Hong, Nano Lett. 11, 5154(2011). [CrossRef]
  19. K. S. Novoselov, A. K. Geim, S. V. Morozov, D. Jiang, Y. Zhang, S. V. Dubonos, I. V. Grigorieva, and A. A. Firsov, Science 306, 666 (2004). [CrossRef]
  20. K. D. Kihm, J. S. Park, S. S. Cheon, and J. S. Lee, J. Heat Transfer—Photogallery 133, 080902 (2011). [CrossRef]
  21. P. Blake, E. W. Hill, A. H. C. Neto, K. S. Novoselov, D. Jiang, R. Yang, T. J. Booth, and A. K. Geim, Appl. Phys. Lett. 91, 063124 (2007). [CrossRef]
  22. L. A. Falkovsky, J. Phys.: Conf. Ser. 129, 012004 (2008). [CrossRef]
  23. K. D. Kihm, Exp. Fluids 48, 547 (2010). [CrossRef]
  24. E. Kretschmann, Z. Physik. A 241, 313 (1971). [CrossRef]
  25. K. D. Kihm, S. Cheon, J. S. Park, H. J. Kim, J. S. Lee, I. T. Kim, and H. J. Yi, Opt. Las. Eng. 50, 64 (2012). [CrossRef]
  26. M. Klintenberg, S. Lebégue, C. Ortiz, B. Sanyal, J. Fransson, and O. Eriksson, J. Phys.: Condens. Matter 21, 335502 (2009). [CrossRef]
  27. X. Wang, Y. P. Chen, and D. D. Nolte, Opt. Express 16, 22105 (2008). [CrossRef]
  28. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North Holland, 1977).
  29. I. T. Kim and K. D. Kihm, Opt. Lett. 35, 393 (2010). [CrossRef]
  30. K. S. Novoselov, D. Jiang, F. Schedin, T. J. Booth, V. V. Khotkevich, S. V. Morozov, and A. K. Geim, Proc. Natl. Acad. Sci. USA 102, 10451 (2005). [CrossRef]
  31. Z. H. Ni, H. M. Wang, J. Kasim, H. M. Fan, T. Yu, Y. H. Wu, Y. P. Feng, and Z. X. Shen, Nano Lett. 7, 2758 (2007). [CrossRef]
  32. P. B. Johnson and R. W. Christy, Phys. Rev. B 6, 4370 (1972). [CrossRef]

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Fig. 1. Fig. 2. Fig. 3.

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