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Long-path second-harmonic interferometer with nanosecond time resolution: reliable diagnostic tool for electron density measurement in pulsed plasma devices |
Optics Letters, Vol. 37, Issue 18, pp. 3855-3857 (2012)
http://dx.doi.org/10.1364/OL.37.003855
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Abstract
We describe the performance of a second-harmonic interferometer (SHI) to measure, on an optical path exceeding 12 m, the electron plasma density of two plasmoids formed in separate theta-pinch chambers and then merged in a central compression chamber after undergoing acceleration and compression. The excellent mechanical stability and a time resolution better than 50 ns suggest the application of SHI, especially in pulsed plasma devices with limited optical accesses.
© 2012 Optical Society of America
OCIS Codes
(000.2170) General : Equipment and techniques
(120.3180) Instrumentation, measurement, and metrology : Interferometry
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: May 9, 2012
Revised Manuscript: July 13, 2012
Manuscript Accepted: July 30, 2012
Published: September 13, 2012
Citation
T. Del Rosso, F. Giammanco, M. G. Anderson, F. Conti, A. Balvis, I. Isakov, V. Matvienko, G. Strashnoy, W. Waggoner, L. Bonelli, E. Paganini, and M. W. Binderbauer, "Long-path second-harmonic interferometer with nanosecond time resolution: reliable diagnostic tool for electron density measurement in pulsed plasma devices," Opt. Lett. 37, 3855-3857 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-18-3855
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