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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 37, Iss. 19 — Oct. 1, 2012
  • pp: 4089–4091

Reflective interferometry for optical metamaterial phase measurements

Kevin O’Brien, N. D. Lanzillotti-Kimura, Haim Suchowski, Boubacar Kante, Yongshik Park, Xiaobo Yin, and Xiang Zhang  »View Author Affiliations

Optics Letters, Vol. 37, Issue 19, pp. 4089-4091 (2012)

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The unambiguous determination of optical refractive indices of metamaterials is a challenging task for device applications and the study of new optical phenomena. We demonstrate here simple broadband phase measurements of metamaterials using spectrally and spatially resolved interferometry. We study the phase response of a π -shaped metamaterial known to be an analog to electromagnetically induced transparency. The measured broadband interferograms give the phase delay or advance produced by the metamaterial in a single measurement. The presented technique offers an effective way of characterizing optical metamaterials including nonlinear and gain–metamaterial systems.

© 2012 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(310.6628) Thin films : Subwavelength structures, nanostructures

ToC Category:

Original Manuscript: July 3, 2012
Revised Manuscript: August 29, 2012
Manuscript Accepted: August 31, 2012
Published: September 26, 2012

Kevin O’Brien, N. D. Lanzillotti-Kimura, Haim Suchowski, Boubacar Kante, Yongshik Park, Xiaobo Yin, and Xiang Zhang, "Reflective interferometry for optical metamaterial phase measurements," Opt. Lett. 37, 4089-4091 (2012)

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