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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 37, Iss. 19 — Oct. 1, 2012
  • pp: 4134–4136

Detection of sub-10 nm emission profile features in organic light-emitting diodes using destructive interference

Norbert Danz, Michael Flämmich, Daniel S. Setz, Benjamin C. Krummacher, Dirk Michaelis, and Thomas Dobbertin  »View Author Affiliations


Optics Letters, Vol. 37, Issue 19, pp. 4134-4136 (2012)
http://dx.doi.org/10.1364/OL.37.004134


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Abstract

The position of light-emitting molecules can be identified using interferometric approaches. Standard schemes utilize constructive interference to obtain a sectioned area of interest with high detection efficiency. The examination of organic light-emitting diodes (OLED) removes the common constraint of low light levels and enables a more generalized analysis. The OLED emitters are located in the front of a metal mirror, giving rise to an approximate two-wave fringe pattern in the far field. It is demonstrated theoretically and experimentally that positions around the field nodes enable the extraction of emitter distribution details within an electroluminescent layer of only 10 nm thickness.

© 2012 Optical Society of America

OCIS Codes
(160.4890) Materials : Organic materials
(230.3670) Optical devices : Light-emitting diodes
(260.2110) Physical optics : Electromagnetic optics
(260.3160) Physical optics : Interference
(300.6280) Spectroscopy : Spectroscopy, fluorescence and luminescence
(350.5730) Other areas of optics : Resolution

ToC Category:
Physical Optics

History
Original Manuscript: July 27, 2012
Revised Manuscript: August 19, 2012
Manuscript Accepted: August 28, 2012
Published: September 28, 2012

Citation
Norbert Danz, Michael Flämmich, Daniel S. Setz, Benjamin C. Krummacher, Dirk Michaelis, and Thomas Dobbertin, "Detection of sub-10 nm emission profile features in organic light-emitting diodes using destructive interference," Opt. Lett. 37, 4134-4136 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-19-4134

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