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Precision increase with two orthogonal analyzers in polarization-resolved second-harmonic generation microscopy |
Optics Letters, Vol. 37, Issue 20, pp. 4173-4175 (2012)
http://dx.doi.org/10.1364/OL.37.004173
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Abstract
We analyze the increase in precision of parameters estimation for polarization-resolved second-harmonic generation imaging microscopy when two intensities are measured with two orthogonal analyzers. The analysis is performed for measuring anisotropy parameters and molecule orientation for samples with cylindrical symmetry in the presence of photon noise with Poisson statistics. The improvement in comparison to global intensity measurement (i.e., without analyzer) is discussed.
© 2012 Optical Society of America
OCIS Codes
(030.6600) Coherence and statistical optics : Statistical optics
(110.4280) Imaging systems : Noise in imaging systems
(190.1900) Nonlinear optics : Diagnostic applications of nonlinear optics
(180.4315) Microscopy : Nonlinear microscopy
(110.5405) Imaging systems : Polarimetric imaging
ToC Category:
Imaging Systems
History
Original Manuscript: July 18, 2012
Manuscript Accepted: August 27, 2012
Published: October 2, 2012
Citation
Philippe Réfrégier, Muriel Roche, Julien Duboisset, and Sophie Brasselet, "Precision increase with two orthogonal analyzers in polarization-resolved second-harmonic generation microscopy," Opt. Lett. 37, 4173-4175 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-20-4173
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