A modified illumination-based method has been proposed to improve resolution of a confocal line-scanning system by 20%. Phase-only apodization is applied to the illumination and combined with confocal detection. The method was studied both theoretically and experimentally. Measurements were performed on silver nanospheres as subresolution test samples, and the captured data were analyzed to determine the modulation transfer function and ultimately the spatial resolution of the system.
© 2012 Optical Society of America
Original Manuscript: July 9, 2012
Revised Manuscript: September 6, 2012
Manuscript Accepted: September 10, 2012
Published: October 11, 2012
László Dudás, József Sinkó, Miklós Erdélyi, and Gábor Szabó, "Confocal line-scanning microscope with modified illumination," Opt. Lett. 37, 4293-4295 (2012)