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Terahertz detection using spectral domain interferometry |
Optics Letters, Vol. 37, Issue 20, pp. 4338-4340 (2012)
http://dx.doi.org/10.1364/OL.37.004338
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Abstract
In this work, we present a novel method based on spectral domain interferometry for the electro-optic (EO) sampling of terahertz (THz) electric fields. This technique allows the use of thick crystals without the drawback of the over-rotation that may occur with intense THz sources, allowing longer temporal scans and thus, better spectral resolution. Using this technique, a phase difference of approximately
© 2012 Optical Society of America
OCIS Codes
(110.4500) Imaging systems : Optical coherence tomography
(040.2235) Detectors : Far infrared or terahertz
(300.6495) Spectroscopy : Spectroscopy, teraherz
ToC Category:
Detectors
History
Original Manuscript: August 10, 2012
Manuscript Accepted: August 30, 2012
Published: October 12, 2012
Citation
Gargi Sharma, Kanwarpal Singh, Ibraheem Al-Naib, Roberto Morandotti, and Tsuneyuki Ozaki, "Terahertz detection using spectral domain interferometry," Opt. Lett. 37, 4338-4340 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-20-4338
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