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Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 37, Iss. 22 — Nov. 15, 2012
  • pp: 4693–4695

Simple method to characterize nonlinear refraction and loss in optical waveguides

Jeremiah J. Wathen, Vincent R. Pagán, and Thomas E. Murphy  »View Author Affiliations


Optics Letters, Vol. 37, Issue 22, pp. 4693-4695 (2012)
http://dx.doi.org/10.1364/OL.37.004693


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Abstract

We describe a technique for accurately measuring the ratio between the imaginary and real parts of the third-order nonlinearity in optical waveguides. Unlike most other methods, it does not depend on precise knowledge of the coupling efficiencies, optical propagation loss, or optical pulse shape. We apply the method to characterize a silicon waveguide, a GaAs waveguide, and AlGaAs waveguides with different alloy concentrations.

© 2012 Optical Society of America

OCIS Codes
(190.0190) Nonlinear optics : Nonlinear optics
(190.3270) Nonlinear optics : Kerr effect
(190.4180) Nonlinear optics : Multiphoton processes
(190.4390) Nonlinear optics : Nonlinear optics, integrated optics
(190.4400) Nonlinear optics : Nonlinear optics, materials
(190.5970) Nonlinear optics : Semiconductor nonlinear optics including MQW

ToC Category:
Nonlinear Optics

History
Original Manuscript: August 17, 2012
Revised Manuscript: October 4, 2012
Manuscript Accepted: October 8, 2012
Published: November 9, 2012

Citation
Jeremiah J. Wathen, Vincent R. Pagán, and Thomas E. Murphy, "Simple method to characterize nonlinear refraction and loss in optical waveguides," Opt. Lett. 37, 4693-4695 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-22-4693


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