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Transient-grating self-referenced spectral interferometry for infrared femtosecond pulse characterization |
Optics Letters, Vol. 37, Issue 23, pp. 4829-4831 (2012)
http://dx.doi.org/10.1364/OL.37.004829
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Abstract
We propose a technique for measuring infrared femtosecond pulses: transient-grating self-referenced spectral interferometry. Based on this technique, we built an extremely simple, alignment-free device and successfully characterized both 38 fs pulses at 800 nm and sub-two-cycle 10 fs pulses at 1.75 μm.
© 2012 Optical Society of America
OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(320.7100) Ultrafast optics : Ultrafast measurements
(320.7120) Ultrafast optics : Ultrafast phenomena
ToC Category:
Ultrafast Optics
History
Original Manuscript: September 28, 2012
Revised Manuscript: October 19, 2012
Manuscript Accepted: October 19, 2012
Published: November 16, 2012
Citation
J. Liu, F. J. Li, Y. L. Jiang, C. Li, Y. X. Leng, T. Kobayashi, R. X. Li, and Z. Z. Xu, "Transient-grating self-referenced spectral interferometry for infrared femtosecond pulse characterization," Opt. Lett. 37, 4829-4831 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-23-4829
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