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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 37, Iss. 23 — Dec. 1, 2012
  • pp: 5012–5014

Ultraprecise measurement of resonance shift for sensing applications

Ciyuan Qiu, Jianbo Chen, and Qianfan Xu  »View Author Affiliations


Optics Letters, Vol. 37, Issue 23, pp. 5012-5014 (2012)
http://dx.doi.org/10.1364/OL.37.005012


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Abstract

Resonator-based optical sensors detect the change of refractive index in the environment by measuring the resonance shift. The sensitivity of such sensors is determined by how precise one can locate the resonant wavelength, which is thought to be limited by the bandwidth and the quality factor of the resonator. Here we show that, with a tunable resonator, one can determine the resonant wavelength with ultrahigh precision. Using a silicon microring resonator with an embedded p-i-n junction for electro-optic tuning, whose quality factor is only 14,000, we measured the resonant wavelength with a resolution of 0.06 pm, which corresponds to an index sensitivity of 107. This resonance measurement for sensing purposes can be done using a fixed-wavelength laser.

© 2012 Optical Society of America

OCIS Codes
(130.6010) Integrated optics : Sensors
(230.3120) Optical devices : Integrated optics devices

ToC Category:
Integrated Optics

History
Original Manuscript: October 3, 2012
Revised Manuscript: November 8, 2012
Manuscript Accepted: November 8, 2012
Published: November 30, 2012

Citation
Ciyuan Qiu, Jianbo Chen, and Qianfan Xu, "Ultraprecise measurement of resonance shift for sensing applications," Opt. Lett. 37, 5012-5014 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-23-5012


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