OSA's Digital Library

Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 37, Iss. 23 — Dec. 1, 2012
  • pp: 5012–5014

Ultraprecise measurement of resonance shift for sensing applications

Ciyuan Qiu, Jianbo Chen, and Qianfan Xu  »View Author Affiliations

Optics Letters, Vol. 37, Issue 23, pp. 5012-5014 (2012)

View Full Text Article

Enhanced HTML    Acrobat PDF (390 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



Resonator-based optical sensors detect the change of refractive index in the environment by measuring the resonance shift. The sensitivity of such sensors is determined by how precise one can locate the resonant wavelength, which is thought to be limited by the bandwidth and the quality factor of the resonator. Here we show that, with a tunable resonator, one can determine the resonant wavelength with ultrahigh precision. Using a silicon microring resonator with an embedded p-i-n junction for electro-optic tuning, whose quality factor is only 14,000, we measured the resonant wavelength with a resolution of 0.06 pm, which corresponds to an index sensitivity of 107. This resonance measurement for sensing purposes can be done using a fixed-wavelength laser.

© 2012 Optical Society of America

OCIS Codes
(130.6010) Integrated optics : Sensors
(230.3120) Optical devices : Integrated optics devices

ToC Category:
Integrated Optics

Original Manuscript: October 3, 2012
Revised Manuscript: November 8, 2012
Manuscript Accepted: November 8, 2012
Published: November 30, 2012

Ciyuan Qiu, Jianbo Chen, and Qianfan Xu, "Ultraprecise measurement of resonance shift for sensing applications," Opt. Lett. 37, 5012-5014 (2012)

Sort:  Author  |  Year  |  Journal  |  Reset  


  1. A. M. Armani, R. P. Kulkarni, S. E. Fraser, R. C. Flagan, and K. J. Vahala, Science 317, 783 (2007). [CrossRef]
  2. L. He, Ş. Özdemir, J. Zhu, W. Kim, and L. Yang, Nature Nanotechnol. 6, 428 (2011). [CrossRef]
  3. I. Ament, J. Prasad, A. Henkel, S. Schmachtel, and C. Sönnichsen, Nano Lett. 12, 1092 (2012). [CrossRef]
  4. D. X. Xu, A. Densmore, A. Delâge, P. Waldron, R. McKinnon, S. Janz, J. Lapointe, G. Lopinski, T. Mischki, E. Post, P. Cheben, and J. H. Schmid, Opt. Express 16, 15137 (2008). [CrossRef]
  5. K. De Vos, I. Bartolozzi, E. Schacht, P. Bienstman, and R. Baets, Opt. Express 15, 7610 (2007). [CrossRef]
  6. D. Duchesne, M. Peccianti, M. R. E. Lamont, M. Ferrera, L. Razzari, F. Légaré, R. Morandotti, S. Chu, B. E. Little, and D. J. Moss, Opt. Express 18, 923 (2010). [CrossRef]
  7. M. Ferrera, D. Duchesne, L. Razzari, M. Peccianti, R. Morandotti, P. Cheben, S. Janz, D.-X. Xu, B. E. Little, S. Chu, and D. J. Moss, Opt. Express 17, 14098 (2009). [CrossRef]
  8. J. Hu, X. Sun, A. Agarwal, and L. C. Kimerling, J. Opt. Soc. Am. B 26, 1032 (2009). [CrossRef]
  9. Q. Xu, D. Fattal, and R. G. Beausoleil, Opt. Express 16, 4309 (2008). [CrossRef]
  10. Q. Xu, B. Schmidt, S. Pradhan, and M. Lipson, Nature 435, 325 (2005). [CrossRef]
  11. P. Dong, S. Liao, D. Feng, H. Liang, D. Zheng, R. Shafiiha, C.-C. Kung, W. Qian, G. Li, X. Zheng, A. V. Krishnamoorthy, and M. Asghari, Opt. Express 17, 22484 (2009). [CrossRef]
  12. A. Biberman and K. Bergman, Rep. Prog. Phys. 75, 046402 (2012). [CrossRef]
  13. C. Qiu, J. Shu, Z. Li, X. Zhang, and Q. Xu, Opt. Express 19, 5143 (2011). [CrossRef]
  14. R. A. Soref and B. R. Bennett, IEEE J. Quantum Electron. 23, 123 (1987). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


Fig. 1. Fig. 2. Fig. 3.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited