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Ronchi test for characterization of nanofocusing optics at a hard x-ray free-electron laser |
Optics Letters, Vol. 37, Issue 24, pp. 5046-5048 (2012)
http://dx.doi.org/10.1364/OL.37.005046
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Abstract
We demonstrate the use of the classical Ronchi test to characterize aberrations in focusing optics at a hard x-ray free-electron laser. A grating is placed close to the focus and the interference between the different orders after the grating is observed in the far field. Any aberrations in the beam or the optics will distort the interference fringes. The method is simple to implement and can provide single-shot information about the focusing quality. We used the Ronchi test to measure the aberrations in a nanofocusing Fresnel zone plate at the Linac Coherent Light Source at 8.194 keV.
© 2012 Optical Society of America
OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(140.7240) Lasers and laser optics : UV, EUV, and X-ray lasers
(220.1010) Optical design and fabrication : Aberrations (global)
(340.0340) X-ray optics : X-ray optics
ToC Category:
X-ray Optics
History
Original Manuscript: October 9, 2012
Manuscript Accepted: November 9, 2012
Published: December 5, 2012
Citation
Daniel Nilsson, Fredrik Uhlén, Anders Holmberg, Hans M. Hertz, Andreas Schropp, Jens Patommel, Robert Hoppe, Frank Seiboth, Vivienne Meier, Christian G. Schroer, Eric Galtier, Bob Nagler, Hae Ja Lee, and Ulrich Vogt, "Ronchi test for characterization of nanofocusing optics at a hard x-ray free-electron laser," Opt. Lett. 37, 5046-5048 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-24-5046
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