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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 37, Iss. 3 — Feb. 1, 2012
  • pp: 434–436

Sub-nano resolution fiber-optic static strain sensor using a sideband interrogation technique

Qingwen Liu, Tomochika Tokunaga, and Zuyuan He  »View Author Affiliations


Optics Letters, Vol. 37, Issue 3, pp. 434-436 (2012)
http://dx.doi.org/10.1364/OL.37.000434


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Abstract

We propose a novel sideband interrogation technique with multiplex radio frequency intensity and phase modulation to measure the resonance frequency difference between two optical resonators. Based on this new technique, an ultrahighly sensitive fiber-optic static strain sensor system consisting of a pair of identical fiber Fabry–Perot interferometers is built by incorporating a cross-correlation data processing algorithm. A static strain resolution down to 0.8 nε is demonstrated experimentally, which makes the sensor system a useful tool for geophysical research applications.

© 2012 Optical Society of America

OCIS Codes
(060.2370) Fiber optics and optical communications : Fiber optics sensors
(060.4080) Fiber optics and optical communications : Modulation
(120.2230) Instrumentation, measurement, and metrology : Fabry-Perot

ToC Category:
Fiber Optics and Optical Communications

History
Original Manuscript: October 31, 2011
Manuscript Accepted: December 11, 2011
Published: February 1, 2012

Citation
Qingwen Liu, Tomochika Tokunaga, and Zuyuan He, "Sub-nano resolution fiber-optic static strain sensor using a sideband interrogation technique," Opt. Lett. 37, 434-436 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-3-434

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