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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 37, Iss. 4 — Feb. 15, 2012
  • pp: 449–451

Determination of layer thickness and optical constants of thin films by using a modified pattern search method

R. Miloua, Z. Kebbab, F. Chiker, K. Sahraoui, M. Khadraoui, and N. Benramdane  »View Author Affiliations

Optics Letters, Vol. 37, Issue 4, pp. 449-451 (2012)

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We propose the use of a pattern search optimization technique in combination with a seed preprocessing procedure to determine the optical constants and thickness of thin films using only the transmittance spectra. The approach is quite flexible, straightforward to implement, and efficient in reaching the best fitting. We demonstrate the effectiveness of the method in extracting optical constants, even when the films are not displaying interference fringes. Comparison to a real-coded genetic algorithm shows that the modified pattern search is fast, almost accurate, and does not need any parameter adjustments. The approach is successfully applied to extract the thickness and optical constants of spray pyrolyzed nanocrystalline CdO thin films.

© 2012 Optical Society of America

OCIS Codes
(310.6860) Thin films : Thin films, optical properties
(310.7005) Thin films : Transparent conductive coatings

ToC Category:
Thin Films

Original Manuscript: October 31, 2011
Revised Manuscript: December 10, 2011
Manuscript Accepted: December 10, 2011
Published: February 3, 2012

R. Miloua, Z. Kebbab, F. Chiker, K. Sahraoui, M. Khadraoui, and N. Benramdane, "Determination of layer thickness and optical constants of thin films by using a modified pattern search method," Opt. Lett. 37, 449-451 (2012)

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