OSA's Digital Library

Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 37, Iss. 4 — Feb. 15, 2012
  • pp: 758–760

Transfer characteristics of rectangular phase gratings in interference microscopy

Peter Lehmann, Weichang Xie, and Jan Niehues  »View Author Affiliations


Optics Letters, Vol. 37, Issue 4, pp. 758-760 (2012)
http://dx.doi.org/10.1364/OL.37.000758


View Full Text Article

Enhanced HTML    Acrobat PDF (322 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

In this Letter, the transfer characteristics of rectangular periodic phase objects are studied. It turns out that there are significant differences compared to amplitude objects. The imaging of an amplitude object can be understood as a linear process, whereas phase objects behave nonlinearly. It is shown that under certain conditions the correct shape of a rectangular phase grating can be obtained by an interference microscope as long as the first order diffraction component passes the optical imaging system. This result is in a good agreement with experimental observations and computer simulation results.

© 2012 Optical Society of America

OCIS Codes
(110.4850) Imaging systems : Optical transfer functions
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
(180.3170) Microscopy : Interference microscopy

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: November 17, 2011
Revised Manuscript: January 11, 2012
Manuscript Accepted: January 11, 2012
Published: February 15, 2012

Virtual Issues
Vol. 7, Iss. 4 Virtual Journal for Biomedical Optics

Citation
Peter Lehmann, Weichang Xie, and Jan Niehues, "Transfer characteristics of rectangular phase gratings in interference microscopy," Opt. Lett. 37, 758-760 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-4-758


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. B. S. Lee and C. T. Strand, Appl. Opt. 29, 3784 (1990). [CrossRef]
  2. G. S. Kino and S. S. C. Chim, Appl. Opt. 29, 3775 (1990). [CrossRef]
  3. F. Gao, R. K. Leach, J. Petzing, and J. M. Coupland, Meas. Sci. Technol. 19, 015303 (2008). [CrossRef]
  4. T. R. Corle and G. S. Kino, Confocal Scanning Optical Microscopy and Related Imaging Systems (Academic Press, 1996).
  5. C. J. R. Sheppard and K. G. Larkin, Appl. Opt. 34, 4731 (1995). [CrossRef]
  6. P. de Groot and X. Colonna de Lega, in Proceedings of Fringe 2005 (Springer, 2005), p. 30.
  7. S. G. Lipson, H. Lipson, and D. S. Tannhauser, Optical Physics (Cambridge University, 1995).
  8. J. W. Goodman, Introduction to Fourier Optics (Roberts & Co., 2005).
  9. A. Harasaki and J. C. Wyant, Appl. Opt. 39, 2101 (2000). [CrossRef]
  10. W. Hillmann, U. Brand, and M. Krystek, Measurement 19, 95 (1996). [CrossRef]
  11. W. Xie, P. Lehmann, and J. Niehues, “Lateral resolution and transfer characteristics of vertical scanning white light interferometers,” Appl. Opt. (to be published).

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article

OSA is a member of CrossRef.

CrossCheck Deposited