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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 37, Iss. 4 — Feb. 15, 2012
  • pp: 758–760

Transfer characteristics of rectangular phase gratings in interference microscopy

Peter Lehmann, Weichang Xie, and Jan Niehues  »View Author Affiliations

Optics Letters, Vol. 37, Issue 4, pp. 758-760 (2012)

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In this Letter, the transfer characteristics of rectangular periodic phase objects are studied. It turns out that there are significant differences compared to amplitude objects. The imaging of an amplitude object can be understood as a linear process, whereas phase objects behave nonlinearly. It is shown that under certain conditions the correct shape of a rectangular phase grating can be obtained by an interference microscope as long as the first order diffraction component passes the optical imaging system. This result is in a good agreement with experimental observations and computer simulation results.

© 2012 Optical Society of America

OCIS Codes
(110.4850) Imaging systems : Optical transfer functions
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
(180.3170) Microscopy : Interference microscopy

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: November 17, 2011
Revised Manuscript: January 11, 2012
Manuscript Accepted: January 11, 2012
Published: February 15, 2012

Virtual Issues
Vol. 7, Iss. 4 Virtual Journal for Biomedical Optics

Peter Lehmann, Weichang Xie, and Jan Niehues, "Transfer characteristics of rectangular phase gratings in interference microscopy," Opt. Lett. 37, 758-760 (2012)

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