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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 37, Iss. 5 — Mar. 1, 2012
  • pp: 975–977

Design of a subnanometer resolution beam position monitor for dielectric laser accelerators

Ken Soong and Robert L. Byer  »View Author Affiliations

Optics Letters, Vol. 37, Issue 5, pp. 975-977 (2012)

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We present a new concept for a beam position monitor with the unique ability to map particle beam position to a measurable wavelength. Coupled with an optical spectrograph, this beam position monitor is capable of subnanometer resolution. We describe one possible design, and through finite-element frequency-domain simulations, we show a resolution of 0.7 nm. Because of its high precision and ultracompact form factor, this device is ideal for future x-ray sources and laser-driven particle accelerators “on a chip.”

© 2012 Optical Society of America

OCIS Codes
(040.1880) Detectors : Detection
(050.2770) Diffraction and gratings : Gratings
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(220.2740) Optical design and fabrication : Geometric optical design

ToC Category:

Original Manuscript: September 8, 2011
Revised Manuscript: January 20, 2012
Manuscript Accepted: January 21, 2012
Published: March 1, 2012

Ken Soong and Robert L. Byer, "Design of a subnanometer resolution beam position monitor for dielectric laser accelerators," Opt. Lett. 37, 975-977 (2012)

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  1. C. McGuinness, E. Colby, and R. L. Byer, J. Mod. Opt. 56, 2142 (2009). [CrossRef]
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