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Optics Letters

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  • Editor: Alan E. Willner
  • Vol. 37, Iss. 6 — Mar. 15, 2012
  • pp: 1079–1081

Disorder mapping in VCSELs using frequency-selective feedback

T. Ackemann, N. Radwell, Y. Noblet, and R. Jäger  »View Author Affiliations


Optics Letters, Vol. 37, Issue 6, pp. 1079-1081 (2012)
http://dx.doi.org/10.1364/OL.37.001079


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Abstract

We report on a simple method with a high spectral and spatial resolution for mapping variations in the cavity resonance of a plano-planar broad-area laser based on frequency-selective feedback. The demonstration experiment uses a vertical-cavity surface-emitting-laser (VCSEL), in which growth induced inhomogeneities are of particular importance. It relies only on a standalone laser with a narrow-bandwidth passive filter avoiding the need for an expensive tunable laser or high-resolution spectrometer.

© 2012 Optical Society of America

OCIS Codes
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(140.4780) Lasers and laser optics : Optical resonators
(140.5960) Lasers and laser optics : Semiconductor lasers
(190.4420) Nonlinear optics : Nonlinear optics, transverse effects in
(140.7260) Lasers and laser optics : Vertical cavity surface emitting lasers

ToC Category:
Lasers and Laser Optics

History
Original Manuscript: November 16, 2011
Revised Manuscript: February 3, 2012
Manuscript Accepted: February 13, 2012
Published: March 14, 2012

Citation
T. Ackemann, N. Radwell, Y. Noblet, and R. Jäger, "Disorder mapping in VCSELs using frequency-selective feedback," Opt. Lett. 37, 1079-1081 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-6-1079


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References

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