OSA's Digital Library

Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 37, Iss. 7 — Apr. 1, 2012
  • pp: 1247–1249

Aperiodic interferometer for six degrees of freedom position measurement

David P. Burt, Phillip S. Dobson, Kevin E. Docherty, Christopher W. Jones, Richard K. Leach, Stephen Thoms, Jonathan M.R. Weaver, and Yuan Zhang  »View Author Affiliations


Optics Letters, Vol. 37, Issue 7, pp. 1247-1249 (2012)
http://dx.doi.org/10.1364/OL.37.001247


View Full Text Article

Enhanced HTML    Acrobat PDF (308 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

We present a new class of interferometer system that is capable of simultaneous measurement of absolute position and rotation in all six degrees of freedom (DOF) with nanometer precision. This novel capability is due to the employment of a system of interference fringes that is not periodic. One of the key strengths offered by this new approach is that the absolute position of the system can be determined with a single measurement, rather than by counting fringes during displacement from a known location. The availability of a simultaneous measurement of all six DOF eliminates many problems associated with conventional interferometry.

© 2012 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.4640) Instrumentation, measurement, and metrology : Optical instruments

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: January 9, 2012
Revised Manuscript: January 30, 2012
Manuscript Accepted: January 30, 2012
Published: March 28, 2012

Citation
David P. Burt, Phillip S. Dobson, Kevin E. Docherty, Christopher W. Jones, Richard K. Leach, Stephen Thoms, Jonathan M.R. Weaver, and Yuan Zhang, "Aperiodic interferometer for six degrees of freedom position measurement," Opt. Lett. 37, 1247-1249 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-7-1247


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. T. Young, Phil. Trans. R. Soc. Lond. 94, 1 (1804). [CrossRef]
  2. D. Shechtman, I. Blech, D. Gratias, and J. W. Cahn, Phys. Rev. Lett. 53, 1951 (1984). [CrossRef]
  3. R. Penrose, “Set of tiles for covering a surface,” UK patent GB1548164 (July4, 1979).
  4. H. Xue and R. Yang, IEE Proc. Gen. Transm. Distrib. 150, 583 (2003). [CrossRef]
  5. N. Yoshimizu, A. Lal, and C. R. Pollock, Opt. Express, 18, 20827 (2010). [CrossRef]
  6. G. L. Turin, IRE Trans. Inf. Theor. 6, 311 (1960). [CrossRef]
  7. International Technology Roadmap for Semiconductors, http://www.itrs.net .

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

Figures

Fig. 1. Fig. 2. Fig. 3.
 

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited