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Snapshot imaging Mueller matrix polarimeter using polarization gratings |
Optics Letters, Vol. 37, Issue 8, pp. 1367-1369 (2012)
http://dx.doi.org/10.1364/OL.37.001367
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Abstract
A snapshot imaging Mueller matrix polarimeter (SIMMP) is theoretically described and empirically demonstrated through simulation. Spatial polarization fringes are localized onto a sample by incorporating polarization gratings (PGs) into a polarization generator module. These fringes modulate the Mueller matrix (MM) components of the sample, which are subsequently isolated with PGs in an analyzer module. The MM components are amplitude modulated onto spatial carrier frequencies which, due to the PGs, maintain high visibility in spectrally broadband illumination. An interference model of the SIMMP is provided, followed by methods of reconstruction and calibration. Lastly, a numerical simulation is used to demonstrate the system’s performance in the presence of noise.
© 2012 Optical Society of America
OCIS Codes
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(260.3160) Physical optics : Interference
(110.5405) Imaging systems : Polarimetric imaging
ToC Category:
Imaging Systems
History
Original Manuscript: December 15, 2011
Revised Manuscript: February 24, 2012
Manuscript Accepted: February 28, 2012
Published: April 12, 2012
Citation
Michael W. Kudenov, Michael J. Escuti, Nathan Hagen, Eustace L. Dereniak, and Kazuhiko Oka, "Snapshot imaging Mueller matrix polarimeter using polarization gratings," Opt. Lett. 37, 1367-1369 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-8-1367
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