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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 38, Iss. 11 — Jun. 1, 2013
  • pp: 1781–1783

Influence of external optical feedback on the alpha factor of semiconductor lasers

Yanguang Yu and Jiangtao Xi  »View Author Affiliations

Optics Letters, Vol. 38, Issue 11, pp. 1781-1783 (2013)

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This Letter presents the results revealing the influence of external optical feedback (EOF) on the alpha factor, or the linewidth enhancement factor, of semiconductor lasers operating on single mode. First, a method is proposed for the measurement of the alpha over a wide range of optical feedback level, which provides an effective way for investigating the dependence of the alpha on laser operating conditions. Second, experimental investigation based on the proposed method is performed on a GaAlAs laser diode with a multiquantum well structure. It is discovered that the alpha value remains approximately constant with increasing injection current, but has a strong dependence on EOF.

© 2013 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(140.5960) Lasers and laser optics : Semiconductor lasers
(280.3420) Remote sensing and sensors : Laser sensors

ToC Category:
Remote Sensing and Sensors

Original Manuscript: September 4, 2012
Revised Manuscript: April 22, 2013
Manuscript Accepted: April 23, 2013
Published: May 20, 2013

Yanguang Yu and Jiangtao Xi, "Influence of external optical feedback on the alpha factor of semiconductor lasers," Opt. Lett. 38, 1781-1783 (2013)

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  1. C. H. Henry, IEEE J. Quantum Electron. 18, 259 (1982). [CrossRef]
  2. M. Osiniski and J. Buus, IEEE J. Quantum Electron. 23, 9 (1987). [CrossRef]
  3. T. Fordell and A. M. Lindberg, IEEE J. Quantum Electron. 43, 6 (2007). [CrossRef]
  4. A. Consoli, B. Bonilla, J. Manuel, G. Tijero, and I. Esquivias, Opt. Express 20, 4979 (2012). [CrossRef]
  5. G.-J. Provost and F. Grillot, IEEE J. Photon. 3, 476 (2011). [CrossRef]
  6. Z. Mi and P. Bhattacharya, IEEE J. Quantum Electron. 43, 363 (2007). [CrossRef]
  7. F. Grillot, N. A. Naderi, M. Pochet, C.-Y. Lin, and L. F. Lester, Appl. Phys. Lett. 93, 191108 (2008). [CrossRef]
  8. E. Gehriga and O. Hess, Appl. Phys. Lett. 86, 203116 (2005). [CrossRef]
  9. S. Melnik, G. Huyet, and A. Uskov, Opt. Express 14, 2950 (2006). [CrossRef]
  10. F. Grillot, B. Dagens, J.-G. Provost, H. Su, and L. F. Lester, IEEE J. Quantum Electron. 44, 946 (2008). [CrossRef]
  11. K. Kechaou, F. Grillot, J. -G. Provost, B. Thedrez, and D. Erasme, Opt. Express 20, 26062 (2012). [CrossRef]
  12. R. Lang and K. Kobayashi, IEEE J. Quantum Electron. 16, 347 (1980). [CrossRef]
  13. G. Acket, D. Lenstra, A. Den Boef, and B. Verbeek, IEEE J. Quantum Electron. 20, 1163 (1984). [CrossRef]
  14. T. Bosch, in Conference on Optoelectronic and Microelectronic Materials and Devices (IEEE, 2004), pp. 385–392.
  15. Y. Yu, G. Giuliani, and S. Donati, IEEE Photon. Technol. Lett. 16, 990 (2004). [CrossRef]
  16. J. Xi, Y. Yu, J. Chicharo, and T. Bosch, IEEE J. Quantum Electron. 41, 1058 (2005). [CrossRef]
  17. Y. Yu, J. Xi, J. Chicharo, and T. Bosch, IEEE J. Quantum Electron. 43, 527 (2007). [CrossRef]
  18. Y. Yu, J. Xi, and J. Chicharo, Opt. Express 19, 9582 (2011). [CrossRef]
  19. Y. Fan, Y. Yu, J. Xi, and J. Chicharo, Appl. Opt. 50, 5064 (2011). [CrossRef]

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