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Optics Letters

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  • Editor: Alan E. Willner
  • Vol. 38, Iss. 11 — Jun. 1, 2013
  • pp: 1811–1813

Measurement method for light transmittance of layered metamaterials

Akihiro Isozaki, Tetsuo Kan, Yoshiharu Ajiki, Kiyoshi Matsumoto, and Isao Shimoyama  »View Author Affiliations


Optics Letters, Vol. 38, Issue 11, pp. 1811-1813 (2013)
http://dx.doi.org/10.1364/OL.38.001811


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Abstract

We propose a method to measure light transmittance of layered metamaterials by placing the metamaterials directly on a Si photodiode. Our measurement method enables the direct detection of transmitted light that appears as an evanescent wave in natural materials. Here, we report the transmittance measurements of a typical metamaterial using this method. The metamaterial was composed of Ag/Al2O3 layers and was fabricated by direct evaporation on the Si photodiode. The measured transmittance agrees with the simulated transmittance. Our results confirmed that this measurement method can determine the transmittance properties of metamaterials and that it is applicable to other types of metamaterials.

© 2013 Optical Society of America

OCIS Codes
(230.5170) Optical devices : Photodiodes
(240.6680) Optics at surfaces : Surface plasmons
(160.3918) Materials : Metamaterials

ToC Category:
Materials

History
Original Manuscript: February 7, 2013
Manuscript Accepted: April 19, 2013
Published: May 21, 2013

Citation
Akihiro Isozaki, Tetsuo Kan, Yoshiharu Ajiki, Kiyoshi Matsumoto, and Isao Shimoyama, "Measurement method for light transmittance of layered metamaterials," Opt. Lett. 38, 1811-1813 (2013)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-38-11-1811


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