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Optics Letters

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  • Editor: Alan E. Willner
  • Vol. 38, Iss. 13 — Jul. 1, 2013
  • pp: 2206–2208

Nonlinear characterization of materials using the D4σ method inside a Z-scan 4f-system

Georges Boudebs, Valentin Besse, Christophe Cassagne, Hervé Leblond, and Cid B. de Araújo  »View Author Affiliations


Optics Letters, Vol. 38, Issue 13, pp. 2206-2208 (2013)
http://dx.doi.org/10.1364/OL.38.002206


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Abstract

We show that direct measurement of the beam radius in Z-scan experiments using a CCD camera at the output of a 4f-imaging system allows higher sensitivity and better accuracy than Baryscan. One of the advantages is to be insensitive to pointing instability of pulsed lasers because no hard (physical) aperture is employed as in the usual Z-scan. In addition, the numerical calculations involved here and the measurement of the beam radius are simplified since we do not measure the transmittance through an aperture and it is not subject to mathematical artifacts related to a normalization process, especially when the diffracted light intensity is very low.

© 2013 Optical Society of America

OCIS Codes
(050.5080) Diffraction and gratings : Phase shift
(160.4330) Materials : Nonlinear optical materials
(190.4420) Nonlinear optics : Nonlinear optics, transverse effects in
(260.5950) Physical optics : Self-focusing

ToC Category:
Materials

History
Original Manuscript: April 16, 2013
Revised Manuscript: May 23, 2013
Manuscript Accepted: May 24, 2013
Published: June 19, 2013

Citation
Georges Boudebs, Valentin Besse, Christophe Cassagne, Hervé Leblond, and Cid B. de Araújo, "Nonlinear characterization of materials using the D4σ method inside a Z-scan 4f-system," Opt. Lett. 38, 2206-2208 (2013)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-38-13-2206


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References

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