OSA's Digital Library

Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 38, Iss. 15 — Aug. 1, 2013
  • pp: 2632–2635

Combining wet etching and real-time damage event imaging to reveal the most dangerous laser damage initiator in fused silica

Guohang Hu, Yuanan Zhao, Xiaofeng Liu, Dawei Li, Qiling Xiao, Kui Yi, and Jianda Shao  »View Author Affiliations


Optics Letters, Vol. 38, Issue 15, pp. 2632-2635 (2013)
http://dx.doi.org/10.1364/OL.38.002632


View Full Text Article

Enhanced HTML    Acrobat PDF (292 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

A reliable method, combining a wet etch process and real-time damage event imaging during a raster scan laser damage test, has been developed to directly determine the most dangerous precursor inducing low-density laser damage at 355 nm in fused silica. It is revealed that 16% of laser damage sites were initiated at the place of the scratches, 49% initiated at the digs, and 35% initiated at invisible defects. The morphologies of dangerous scratches and digs were compared with those of moderate ones. It is found that local sharp variation at the edge, twist, or inside of a subsurface defect is the most dangerous laser damage precursor.

© 2013 Optical Society of America

OCIS Codes
(140.3330) Lasers and laser optics : Laser damage
(140.3380) Lasers and laser optics : Laser materials
(140.3440) Lasers and laser optics : Laser-induced breakdown

ToC Category:
Lasers and Laser Optics

History
Original Manuscript: May 10, 2013
Revised Manuscript: June 18, 2013
Manuscript Accepted: June 25, 2013
Published: July 18, 2013

Citation
Guohang Hu, Yuanan Zhao, Xiaofeng Liu, Dawei Li, Qiling Xiao, Kui Yi, and Jianda Shao, "Combining wet etching and real-time damage event imaging to reveal the most dangerous laser damage initiator in fused silica," Opt. Lett. 38, 2632-2635 (2013)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-38-15-2632


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. B. C. Stuart, M. D. Feit, S. Herman, A. M. Rubenchik, B. W. Shore, and M. D. Perry, Phys. Rev. B 53, 1749 (1996). [CrossRef]
  2. J. Neauport, C. Ambard, P. Cormont, N. Darbois, J. Destribats, C. Luitot, and O. Rondeau, Opt. Express 17, 20448 (2009). [CrossRef]
  3. A. K. Burnham, L. Hackel, P. Wegner, T. Parham, L. Hrubesh, B. Penetrante, P. Whitman, S. Demos, J. Menapace, M. Runkel, M. Fluss, M. Feit, M. Key, and T. Biesiada, Proc. SPIE 4679, 173 (2001). [CrossRef]
  4. S. Papernov and A. W. Schmid, Proc. SPIE 7132, 71321J (2008). [CrossRef]
  5. G. Hu, Y. Zhao, D. Li, Q. Xiao, J. Shao, and Z. Fan, Surf. Interface Anal. 42, 1465 (2010). [CrossRef]
  6. T. I. Suratwala, P. E. Miller, J. D. Bude, W. A. Steele, N. Shen, M. V. Monticelli, M. D. Feit, T. A. Laurence, M. A. Norton, C. W. Carr, and L. L. Wong, J. Am. Ceram. Soc. 94, 416 (2011). [CrossRef]
  7. T. Suratwala, R. Steele, M. D. Feit, L. Wong, P. Miller, J. Menapace, and P. Davis, J. Non-Cryst. Solids 354, 2023 (2008). [CrossRef]
  8. T. Suratwala, L. Wong, P. Miller, M. D. Feit, J. Menapace, R. Steele, P. Davis, and D. Walmer, J. Non-Cryst. Solids 352, 5601 (2006). [CrossRef]
  9. D. W. Camp, M. R. Kozlowski, L. M. Sheehan, M. Nichols, M. Dovik, R. Raether, and I. Thomas, Proc. SPIE 3244, 356 (1998). [CrossRef]
  10. C. L. Battersby, L. M. Sheehan, and M. R. Kozlowski, Proc. SPIE 3578, 446 (1998). [CrossRef]
  11. H. Bercegol, R. Courchinoux, M. Josse, and J. L. Rullier, Proc. SPIE 5647, 78 (2004). [CrossRef]
  12. H. Bercegol and P. Grua, Proc. SPIE 7132, 71321B (2008). [CrossRef]
  13. H. Bercegol, P. Grua, D. Hébert, and J.-P. Morreeuw, Proc. SPIE 6720, 672003 (2007). [CrossRef]
  14. T. A. Laurence, J. D. Bude, N. Shen, T. Feldman, and P. E. Miller, Appl. Phys. Lett. 94, 151114 (2009). [CrossRef]
  15. T. A. Laurence, J. D. Bude, N. Shen, P. E. Miller, W. A. Steele, G. Guss, J. J. Adams, L. L. Wong, M. D. Feit, and T. I. Suratwala, Proc. SPIE 7504, 750416 (2009). [CrossRef]
  16. P. E. Miller, T. I. Suratwala, J. D. Bude, T. A. Laurence, N. Shen, W. A. Steele, M. D. Feit, J. A. Menapace, and L. L. Wong, Proc. SPIE 7504, 75040X (2009). [CrossRef]
  17. J. E. Wolfe and S. E. Schrauth, Proc. SPIE 6403, 640328 (2007). [CrossRef]
  18. G. Hu, Y. Zhao, J. Shao, K. Yi, D. Li, X. Liu, and Q. Xiao, J. Opt. Soc. Am. B 30, 1186 (2013). [CrossRef]
  19. P. E. Miller, J. D. Bude, T. I. Suratwala, N. Shen, T. A. Laurence, W. A. Steele, J. Menapace, M. D. Feit, and L. L. Wong, Opt. Lett. 35, 2702 (2010). [CrossRef]
  20. S. O. Kucheyev and S. G. Demos, Appl. Phys. Lett. 82, 3230 (2003). [CrossRef]
  21. L. Skuja, J. Non-Cryst. Solids 239, 16 (1998). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited