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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 38, Iss. 15 — Aug. 1, 2013
  • pp: 2838–2841

Phase-tilting interferometry for optical testing

Jianxin Li, Rihong Zhu, Lei Chen, and Yong He  »View Author Affiliations


Optics Letters, Vol. 38, Issue 15, pp. 2838-2841 (2013)
http://dx.doi.org/10.1364/OL.38.002838


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Abstract

Phase-tilting interferometry for optical testing is proposed to retrieve the phase from interferograms with random phase tilts. The Radon transform is used to extract the tilted phase plane, and the phase distribution is retrieved by the least squares method. The proposed method has been applied to simulated and experimental interferograms, obtaining satisfactory results. The proposed method has high accuracy and good robustness, and it can be used for interferometric measurements in environmental vibrations. Additionally, it can be used for interferometers without a phase shifter to achieve high-precision analysis.

© 2013 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: May 2, 2013
Revised Manuscript: July 6, 2013
Manuscript Accepted: July 6, 2013
Published: July 29, 2013

Citation
Jianxin Li, Rihong Zhu, Lei Chen, and Yong He, "Phase-tilting interferometry for optical testing," Opt. Lett. 38, 2838-2841 (2013)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-38-15-2838

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