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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 38, Iss. 16 — Aug. 15, 2013
  • pp: 2934–2937

Evaluation of disparate laser beam deflection technologies by means of number and rate of resolvable spots

Peter Bechtold, Ralph Hohenstein, and Michael Schmidt  »View Author Affiliations


Optics Letters, Vol. 38, Issue 16, pp. 2934-2937 (2013)
http://dx.doi.org/10.1364/OL.38.002934


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Abstract

We introduce a method to objectively evaluate systems of differing beam deflection technologies that commonly are described by disparate technical specifications. Using our new approach based on resolvable spots we will compare commercially available random-access beam deflection technologies, namely galvanometer scanners, piezo scanners, MEMS scanners, acousto-optic deflectors, and electro-optic deflectors.

© 2013 Optical Society of America

OCIS Codes
(120.4570) Instrumentation, measurement, and metrology : Optical design of instruments
(120.4820) Instrumentation, measurement, and metrology : Optical systems
(120.5800) Instrumentation, measurement, and metrology : Scanners
(080.4035) Geometric optics : Mirror system design

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: May 24, 2013
Revised Manuscript: July 11, 2013
Manuscript Accepted: July 15, 2013
Published: August 2, 2013

Citation
Peter Bechtold, Ralph Hohenstein, and Michael Schmidt, "Evaluation of disparate laser beam deflection technologies by means of number and rate of resolvable spots," Opt. Lett. 38, 2934-2937 (2013)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-38-16-2934

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