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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 38, Iss. 17 — Sep. 1, 2013
  • pp: 3374–3376

Leakage radiation interference microscopy

Emiliano Descrovi, Elsie Barakat, Angelo Angelini, Peter Munzert, Natascia De Leo, Luca Boarino, Fabrizio Giorgis, and Hans Peter Herzig  »View Author Affiliations


Optics Letters, Vol. 38, Issue 17, pp. 3374-3376 (2013)
http://dx.doi.org/10.1364/OL.38.003374


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Abstract

We present a proof of principle for a new imaging technique combining leakage radiation microscopy with high-resolution interference microscopy. By using oil immersion optics it is demonstrated that amplitude and phase can be retrieved from optical fields, which are evanescent in air. This technique is illustratively applied for mapping a surface mode propagating onto a planar dielectric multilayer on a thin glass substrate. The surface mode propagation constant estimated after Fourier transformation of the measured complex field is well matched with an independent measurement based on back focal plane imaging.

© 2013 Optical Society of America

OCIS Codes
(180.3170) Microscopy : Interference microscopy
(240.6690) Optics at surfaces : Surface waves
(110.3175) Imaging systems : Interferometric imaging

ToC Category:
Microscopy

History
Original Manuscript: July 18, 2013
Revised Manuscript: August 2, 2013
Manuscript Accepted: August 3, 2013
Published: August 26, 2013

Citation
Emiliano Descrovi, Elsie Barakat, Angelo Angelini, Peter Munzert, Natascia De Leo, Luca Boarino, Fabrizio Giorgis, and Hans Peter Herzig, "Leakage radiation interference microscopy," Opt. Lett. 38, 3374-3376 (2013)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-38-17-3374


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