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Optics Letters

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  • Editor: Alan E. Willner
  • Vol. 38, Iss. 18 — Sep. 15, 2013
  • pp: 3518–3521

Beam deflection measurement of time and polarization resolved ultrafast nonlinear refraction

Manuel R. Ferdinandus, Honghua Hu, Matthew Reichert, David J. Hagan, and Eric W. Van Stryland  »View Author Affiliations


Optics Letters, Vol. 38, Issue 18, pp. 3518-3521 (2013)
http://dx.doi.org/10.1364/OL.38.003518


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Abstract

We modify the well-known photothermal beam deflection technique to study ultrafast nonlinearities. Using phase-sensitive detection we directly measure the temporal and polarization dynamics of nonlinear refraction (NLR) with sensitivity to optically induced phase changes of approximately λ/20,000. We use the relative polarization dependence of excitation and probe to separate the isotropic and reorientational components of the NLR.

© 2013 Optical Society of America

OCIS Codes
(190.3270) Nonlinear optics : Kerr effect
(190.4400) Nonlinear optics : Nonlinear optics, materials

ToC Category:
Nonlinear Optics

History
Original Manuscript: June 6, 2013
Manuscript Accepted: July 7, 2013
Published: September 5, 2013

Citation
Manuel R. Ferdinandus, Honghua Hu, Matthew Reichert, David J. Hagan, and Eric W. Van Stryland, "Beam deflection measurement of time and polarization resolved ultrafast nonlinear refraction," Opt. Lett. 38, 3518-3521 (2013)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-38-18-3518


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