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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 38, Iss. 18 — Sep. 15, 2013
  • pp: 3542–3545

N-doped ZnO thin film for development of magnetic field sensor based on surface plasmon resonance

Kajal Jindal, Monika Tomar, R. S. Katiyar, and Vinay Gupta  »View Author Affiliations

Optics Letters, Vol. 38, Issue 18, pp. 3542-3545 (2013)

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Magnetic-field-dependent optical properties of nitrogen-doped ZnO (ZnO:N) thin films were investigated using surface plasmon resonance (SPR) and a highly sensitive (4.65/Tesla) magnetic field sensor has been realized. The refractive index (RI) of ZnO:N film increases from 1.949 to 2.025 with increase in N doping from 0% to 10% demonstrating tunable RI. In contrast to pure ZnO, SPR curves for ZnO:N films exhibit a shift toward lower angles with increasing applied magnetic field from 0 to 35 mT due to change in reflectance of light upon reflection from ferromagnetic surface. Results indicate promising application of ferromagnetic ZnO:N film as a magnetic field sensor.

© 2013 Optical Society of America

OCIS Codes
(130.6010) Integrated optics : Sensors
(240.6680) Optics at surfaces : Surface plasmons
(310.0310) Thin films : Thin films

ToC Category:
Integrated Optics

Original Manuscript: June 26, 2013
Revised Manuscript: August 8, 2013
Manuscript Accepted: August 10, 2013
Published: September 5, 2013

Kajal Jindal, Monika Tomar, R. S. Katiyar, and Vinay Gupta, "N-doped ZnO thin film for development of magnetic field sensor based on surface plasmon resonance," Opt. Lett. 38, 3542-3545 (2013)

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