We present a Fourier-domain filtering method for charge-coupled device (CCD)-based thermoreflectance microscopy to improve the thermal imaging speed while maintaining high thermal sensitivity. The time-varying reflected light distribution from the surface of bias-modulated microresistor was recorded by a CCD camera in free-run mode and converted to the frequency domain using the fast Fourier transform (FFT) for all pixels of the CCD. After frequency peak filtering followed by inverse FFT, a thermoreflectance image was obtained. The imaging results of the proposed method were quantitatively compared with those of the conventional four-bucket method, showing that the Fourier-domain filtering method can provide thermal imaging 24–42 times faster than the four-bucket method, depending on the required thermal sensitivity.
© 2013 Optical Society of America
Original Manuscript: June 11, 2013
Revised Manuscript: August 14, 2013
Manuscript Accepted: August 14, 2013
Published: September 9, 2013
Vol. 8, Iss. 10 Virtual Journal for Biomedical Optics
Woo June Choi, Seon Young Ryu, Jun Ki Kim, Dong Uk Kim, Geon Hee Kim, and Ki Soo Chang, "High-speed thermoreflectance microscopy using charge-coupled device-based Fourier-domain filtering," Opt. Lett. 38, 3581-3584 (2013)