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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 38, Iss. 19 — Oct. 1, 2013
  • pp: 3704–3707

Phase measurements on terahertz waves

A. H. Cordes, D. H. Thomas, and J. P. von der Weid  »View Author Affiliations

Optics Letters, Vol. 38, Issue 19, pp. 3704-3707 (2013)

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The change in phase of the free space terahertz (THz) electric field as a sample of material introduced into the THz beampath of a CW THz system is measured and used to calculate the index of refraction of materials at 250 GHz.

© 2013 Optical Society of America

OCIS Codes
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(110.6795) Imaging systems : Terahertz imaging

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: June 21, 2013
Revised Manuscript: August 15, 2013
Manuscript Accepted: August 21, 2013
Published: September 16, 2013

A. H. Cordes, D. H. Thomas, and J. P. von der Weid, "Phase measurements on terahertz waves," Opt. Lett. 38, 3704-3707 (2013)

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