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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 38, Iss. 19 — Oct. 1, 2013
  • pp: 3784–3787

Robustness of antenna-coupled distributed bolometers

Alexander Cuadrado, Manuel Silva-López, Francisco Javier González, and Javier Alda  »View Author Affiliations

Optics Letters, Vol. 38, Issue 19, pp. 3784-3787 (2013)

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This Letter shows the effect of the geometrical and material properties of lead lines and connections on the robustness and reliability of optical antennas working as distributed bolometers. We analyze the operational limits of the biasing voltage using a mutiphysics finite element method. We demonstrate that, after evaluating the effect of the electromagnetic irradiance falling on the device, biasing voltage is the main limiting factor to maintain operative titanium optical antennas. Results have been experimentally verified by finding the biasing values needed to destroy optical antennas working as distributed bolometers. Structural damage has been identified from scanning electron microscopy images.

© 2013 Optical Society of America

OCIS Codes
(040.3060) Detectors : Infrared
(230.3990) Optical devices : Micro-optical devices
(350.1820) Other areas of optics : Damage
(220.4241) Optical design and fabrication : Nanostructure fabrication
(130.6622) Integrated optics : Subsystem integration and techniques
(050.6624) Diffraction and gratings : Subwavelength structures

ToC Category:
Optical Design and Fabrication

Original Manuscript: July 17, 2013
Revised Manuscript: August 23, 2013
Manuscript Accepted: August 23, 2013
Published: September 19, 2013

Alexander Cuadrado, Manuel Silva-López, Francisco Javier González, and Javier Alda, "Robustness of antenna-coupled distributed bolometers," Opt. Lett. 38, 3784-3787 (2013)

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